TLE7263E Datasheet, PDF (58/63 Pages) Infineon Technologies AG – Integrated HS-CAN, LIN, LDO and HS Switch System Basis Chip

TLE 7263E
7
Application Information
Application Information
7.1
ESD Tests
Tests for ESD robustness according to IEC61000-4-2 “gun test” (150pF, 330Ω) have
been performed. The results and test condition are available in a test report.
Table 14 ESD “GUN test”
Performed Test
Result Unit
ESD at pin CANH, CANL, LIN, Vs ≥ +8
kV
versus GND
ESD at pin CANH, CANL, LIN, Vs ≤ -8
kV
versus GND
Remarks
1)_{Positive pulse}
1)_{Negative pulse}
1) ESD susceptibility “ESD GUN” according LIN EMC 1.3 Test Specification, Section 4.3. (IEC 61000-4-2) -
Tested by external test house (IBEE Zwickau, EMC Test report Nr. 11-11-06).
Data Sheet
58
Rev. 1.51, 2007-06-22