841N4830 Datasheet, PDF (9/28 Pages) Integrated Device Technology – Fourth generation FemtoClock

841N4830 DATA SHEET
Parameter Measurement Information
2V
1.85V±0.15V
2V
1.65V±9.1% 1.575V±0.225V
1.65V±9.1%
V_DDA
V_DD,
V_DDA
V_{DD_OSC}
V_{DDO_REF}
V_EE
SCOPE
REF_OUT
nREF_OUT
-1.3V±0.3V
3.3V LVPECL Output Load Test Circuit
V_DDA
V_DD,
V_DDA
V_{DD_OSC,}
V_DDOB,
V_{DDO_QA3,}
V_EE
SCOPE
Q
-1.65V±9.1%
3.3V LVCMOS Output Load Test Circuit
3.3V±9.1%
3.15V±14.3%
3.3V±9.1%
V_DDA
VV_{DDDD_, OSC}^VDDA
V_DDO
33Ω
V_EE
33Ω
50Ω
49.9Ω
50Ω
Qx
2pF
nQx
49.9Ω
2pF
475Ω 475Ω
This load condition is used for V_HIGH, V_LOW, V_RB, t_STABLE and
V_CROSS, V_CROSS measurements.
3.3V HCSL Output Load Test Circuit
3.3V±9.1%
3.15V±14.3%
3.3V±9.1%
V_DDA
V_DD,
V_DDA
V_{DD_OSC}
V_DDO
V_EE
50Ω
50Ω
SCOPE
Qx
nQx
475Ω 475Ω
This load condition is used for I_DD, tjit(cc), tsk(b), odc and tjit(Ø)
measurements.
3.3V HCSL Output Load Test Circuit
V_DD
nCLK
V
PP
CLK
GND
Cross Points
V
CMR
nREF_OUT
QA3, QB,
REF_OUT
20%
80%
t_R
80%
t_F
V_{SW I N G}
20%
Differential Input Level
Rev E 7/1/15
Output Rise/Fall Time (LVPECL, LVCMOS)
9
FEMTOCLOCK® NG CRYSTAL-TO-HCSL FREQUENCY SYNTHESIZER