8413S12 Datasheet, PDF (12/33 Pages) Integrated Device Technology – Selectable external crystal or differential

8413S12 DATA SHEET
Table 7H. AC Characteristics, V_DD = 3.3V ± 5%, V_{DDO_[A:E]} = V_{DDO_F} = 3.3V ± 5%; and
V_DD = 3.3V ± 5%, V_{DDO_G} = V_{DDO_QREF} = 3.3V ± 5% or 2.5V ± 5%, T_A = -40°C to 85°C
Symbol Parameter
Test Conditions
Minimum
V_RB
Ring-Back Voltage Margin;
NOTE 1, 2
Q[A:E],
nQ[A:E]
-100
t_STABLE
Time before V_RB is allowed;
NOTE 1, 2
Q[A:E],
nQ[A:E]
500
V_MAX
Absolute Max Output Voltage; Q[A:E],
NOTE 3, 4
nQ[A:E]
V_MIN
Absolute Min Output Voltage; Q[A:E],
NOTE 3, 5
nQ[A:E]
-300
V_CROSS
Absolute Crossing Voltage;
NOTE 3, 6, 7
Q[A:E],
nQ[A:E]
250
V_CROSS
Total Variation of V_CROSS over
All Edges; NOTE 3, 6, 8
Q[A:E],
nQ[A:E]
t_SLEW+
Rising Edge Rate; NOTE 1, 9
Q[A:E],
nQ[A:E]
0.6
t_SLEW-
Falling Edge Rate; NOTE 1, 9
Q[A:E],
nQ[A:E]
0.6
odc
Output Duty Cycle
Q[A:E],
nQ[A:E]
48
tjit(Ø)
RMS Phase Jitter, (Random) QREF[0:1]
25MHz, Integration Range:
(10kHz to 5MHz)
QF
20% to 80%
400
t_R /t_F
Output Rise/Fall Time
QG
20% to 80%
400
QREF[0:1]
20% to 80%
300
odc
Output Duty Cycle
QF
measured at V_{DDO_F}/2
48
QG
measured at V_{DDO_G}/2
45
QREF[0:1] measured at V_{DDO_QREF}/2
45
Typical
0.6
50
50
50
Maximum Units
100
mV
ps
1150
mV
mV
550
mV
140
mV
5.5
V/ns
5.5
V/ns
52
%
0.96
ps
1400
ps
1400
ps
1400
ps
52
%
55
%
55
%
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE: All parameters measured at f_OUT unless noted otherwise.
NOTE 1: Measurement taken from differential waveform.
NOTE 2: t_STABLE is the time the differential clock must maintain a minimum ±150mV differential voltage after rising/falling edges before it is
allowed to drop back into the Vrb ±100mV range. See Parameter Measurement Information Section.
NOTE 3: Measurement taken from single-ended waveform.
NOTE 4: Defined as the maximum instantaneous voltage including overshoot. See Parameter Measurement Information Section.
NOTE 5: Defined as the minimum instantaneous voltage including undershoot. See Parameter Measurement Information Section.
NOTE 6: Measured at the crossing point where the instantaneous voltage value of the rising edge of Q[Ax:Ex] equals the falling edge of
nQ[Ax:Ex].
NOTE 7: Refers to the total variation from the lowest crossing point to the highest, regardless of which edge is crossing. Refers to all crossing
points for this measurement.
NOTE 8: Defined as the total variation of all crossing voltages of rising Q[Ax:Ex] and falling nQ[Ax:Ex]. This is the maximum allowed variance
in Vcross for any particular system.
NOTES continued on next page.
NOTE 9: Measured from -150mV to +150mV on the differential waveform (derived from Q[Ax:Ex] minus nQ[Ax:Ex]). The signal must be
monotonic through the measurement region for rise and fall time. The 300mV measurement window is centered on the differential zero
crossing.
HCSL/ LVCMOS CLOCK GENERATOR
12
REVISION D 1/27/15