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7133LA70GB Datasheet, PDF (11/16 Pages) Integrated Device Technology – HIGH SPEED 2K X 16 DUAL-PORT SRAM
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM
Military, Industrial and Commercial Temperature Ranges
Timing Waveform of Write Cycle No. 1 (R/W Controlled Timing)(1,5,8)
tWC
ADDRESS
OE
CE
R/W (9)
DATAOUT
DATAIN
tAS(6)
tLZ
tAW
tWP(2)
tWZ (7)
(4)
tWR(3)
tOW
tDW
tDH
tHZ(7)
tHZ (7)
(4)
2746 drw 09
Write Cycle No. 2 (CE Controlled Timing)(1,5)
ADDRESS
CE
R/W (9)
DATAIN
tAS(6)
tWC
tAW
tEW (2)
tDW
tWR
tDH
2746 drw 10
NOTES:
1. R/W or CE must be HIGH during all address transitions.
2. A write occurs during the overlap (tEW or tWP) of a CE = VIL and a R/W = VIL.
3. tWR is measured from the earlier of CE or R/W going HIGH to the end of the write cycle.
4. During this period, the I/O pins are in the output state, and input signals must not be applied.
5. If the CE LOW transition occurs simultaneously with or after the R/W LOW transition, the outputs remain in the High-impedance state.
6. Timing depends on which enable signal (CE or R/W) is asserted last.
7. Timing depends on which enable signal is de-asserted first, CE or OE.
8. If OE is LOW during a R/W controlled write cycle, the write pulse width must be the larger of tWP or (tWZ + tDW) to allow the I/O drivers to turn off and data to be placed
on the bus for the required tDW. If OE is HIGH during an R/W controlled write cycle, this requirement does not apply and the write pulse can be as short as the
specified tWP.
9. R/W for either upper or lower byte.
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