HY29DS162 Datasheet, PDF (32/48 Pages) Hynix Semiconductor – 16 Megabit (2M x 8/1M x 16) Super-Low Voltage, Dual Bank, Simultaneous Read/Write, Flash Memory

HY29DS162/HY29DS163
KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
Steady
OUTPUTS
Changing from H to L
Changing from L to H
Don't Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Centerline is High Impedance State
(High Z)
TEST CONDITIONS
V _CC
DEVICE
UNDER
TEST
16.7
KOhm
OUT
C_L
16.7
KOhm
Figure 13. Test Setup
Table 17. Test Specifications
Test
Condition
All Speed
Versions
Unit
Output Load
Figure 13
Output Load Capacitance (C_L)
30
pF
Input Rise and Fall Times
5
ns
Input Signal Low Level
0.0
V
Input Signal High Level
2.0
V
Input Timing Measurement
Signal Level
1.0
V
Output Timing Measurement
Signal Level
1.0
V
Note: Timing measurements are made at the reference
levels specified above regardless of where the illustrations
in the timing diagrams appear to indicate the measurement
is made
2.0 V
Input 1.0 V
Measurement Level
1.0 V Output
0.0 V
Figure 14. Input Waveforms and Measurement Levels
32
r1.3/Apr 01