FXLS8471Q Datasheet, PDF (13/75 Pages) Freescale Semiconductor, Inc – Linear Accelerometer

5
Device Characteristics
5.1 Mechanical characteristics
Table 2. Mechanical characteristics @ VDD = 2.5 V, VDDIO = 1.8 V T = 25°C unless otherwise noted.
Parameter
Test Conditions
Symbol
Min Typ
Measurement range⁽¹⁾
±2 g mode
±4 g mode
±8 g mode
±2 g mode
FS_ACC
±2
±4
±8
4096
0.244
Sensitivity
±4 g mode
SEN_ACC
2048
0.488
Sensitivity change with temperature⁽¹⁾
Sensitivity accuracy
Zero-g level offset accuracy⁽²⁾
Zero-g level offset accuracy post-board mount⁽³⁾
Zero-g level change versus temperature
Nonlinearity (deviation from straight line)⁽⁴⁾⁽⁵⁾
Self-Test output change⁽⁶⁾
X
Y
Z
±8 g mode
±2 g, ±4 g, ±8 g modes
@ 25°C
±2 g, ±4 g, ±8 g modes
±2 g, ±4 g, ±8 g modes
-40°C to 85°C⁽¹⁾
Over ±1 g range normal mode
TCS_ACC
SEN-TOL_ACC
OFF_ACC
OFF-PBM_ACC
TCO_ACC
NL_ACC
1024
0.976
±0.01
±2.5
±20
±30
±0.2
±0.5
Set to ±2 g mode
STOC_ACC
+192
+270
+1275
Output noise density⁽⁴⁾⁽⁷⁾
Operating temperature range
ODR = 400 Hz, normal mode ND_ACC-NM
126
ODR = 400 Hz, low-noise mode⁽¹⁾ ND_ACC-LNM
99
Top
-40
1. Dynamic range is limited to ±4 g when in the low-noise mode.
2. Before board mount.
3. Post-board mount offset specifications are based on a 2-layer PCB design.
4. Evaluation only.
5. After post-board mount corrections for sensitivity, cross axis and offset. Refer to AN4399 for more information.
6. Self-test is only exercised along one direction for each sensitive axis.
7. Measured using earth's gravitational field (1 g) with the device oriented horizontally (+Z axis up) and stationary.
Max Unit
g
LSB/g
mg/LSB
LSB/g
mg/LSB
LSB/g
mg/LSB
%/°C
%SEN_ACC
mg
mg
mg/°C
%FS_ACC
LSB
µg/√Hz
µg/√Hz
+85
°C
Sensors
Freescale Semiconductor, Inc.
FXLS8471Q
13