MC3410 Datasheet, PDF (70/75 Pages) NXP Semiconductors – 10-Bit high-speed multiplying D/A converter

MC3410 3-Axis Accelerometer
Datasheet
12 EXAMPLE MC3410 CONFIGURATION
This section shows an example configuration, for demonstration purposes. The sequences are
described as register read and write cycles; the I2C device ID and protocol are implied.
12.1 EXAMPLE: SHAKE, TAP & DROP THRESHOLDS DEMO
Sequence Register Data to Write
1
0x07
0x43
2
0x06
0xE4
3
0x09
0x40
4
0x0A
0x03
5
0x0B
0x00
6
0x0C
0x1F
7
0x20
0x33
8
0x2B
0x44
9
0x2C
0x95
11
0x2E
0x95
13
0x30
0x40
14
0x31
0xAB
15
0x32
0x64
16
0x07
0x41
Table 42. Tap Demo Register Sequence
Comments
Go to STANDBY state, configure INTN pin, active
low (IAH = 0), active drive (IPP = 1)
Enable shake interrupt in X,Y or Z-axis, enable tap
interrupt, disable others
Enable Tap detection on Y-axis
Tap detected for pulses > Tap threshold and for 4
or fewer sample periods
Set drop mode A, drop debounce set to be 1 drop
event, no drop interrupt
Set shake debounce register to 31 adjacent shake
events
Select +/- 2g range at 10-bit resolution; LPF
Bandwidth=64Hz; GINT updates at sample rate
Set shake threshold to be approximately 1.5g
(1.3 + 44 x ~2.9 mg/LSB).
Set up/down Z axis threshold to ~0.5g (~60deg)
Set right/left Z axis threshold to ~0.5g (~60deg)
Set front/back Z axis threshold to ~39deg
Set drop threshold to < ~0.25g
Set tap threshold to ~4.7 snap
Go to WAKE state, enable sampling, configure
INTN pin, active low (IAH = 0), active drive (IPP =
1)
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