SAMA5D43_14 Datasheet, PDF (55/1776 Pages) ATMEL Corporation – Atmel | SMART ARM-based Embedded MPU

11. Debug and Test
11.1
Description
The device features a number of complementary debug and test capabilities.
A common JTAG/ICE (In-Circuit Emulator) port is used for standard debugging functions, such as downloading
code and single-stepping through programs.
A 2-pin debug port Serial Wire Debug (SWD). SWD replaces the 5-pin JTAG port and provides an easy and risk
free alternative to JTAG as the two signals SWDIO and SWCLK are overlaid on the TMS and TCK pins, allowing
for bi-modal devices that provide the other JTAG signals. These extra JTAG pins can be switched to other uses
when in SWD mode.
The Debug Unit provides a two-pin UART that can be used to upload an application into internal SRAM. It
manages the interrupt handling of the internal COMMTX and COMMRX signals that trace the activity of the Debug
Communication Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from a PC-based test
environment.
11.2
Embedded Characteristics
 Cortex-A5 Real-time In-circuit Emulator
̶ Two real-time Watchpoint Units
̶ Two Independent Registers: Debug Control Register and Debug Status Register
̶ Test Access Port Accessible through JTAG Protocol
̶ Debug Communications Channel
̶ Serial Wire Debug
 Debug Unit
̶ Two-pin UART
̶ Debug Communication Channel Interrupt Handling
̶ Chip ID Register
 IEEE1149.1 JTAG Boundary-scan on All Digital Pins
SAMA5D4 Series [DATASHEET]
55
Atmel-11238A-ATARM-SAMA5D4-Datasheet_30-Sep-14