AM1705DPTPA3 Datasheet, PDF (34/164 Pages) Texas Instruments – AM1705 ARM Microprocessor

AM1705
SPRS657D – FEBRUARY 2010 – REVISED MARCH 2013
4 Device Operating Conditions
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4.1 Absolute Maximum Ratings Over Operating Junction Temperature Range
(Unless Otherwise Noted) ⁽¹⁾
Supply voltage ranges
Input voltage ranges
Core
(CVDD, RVDD, PLL0_VDDA ) ⁽²⁾
I/O, 1.8V
(USB0_VDDA18) ⁽²⁾
I/O, 3.3V
(DVDD, USB0_VDDA33) ⁽²⁾
V_I I/O, 1.2V
(OSCIN)
V_I I/O, 3.3V
(Steady State)
V_I I/O, 3.3V
(Transient)
V_I I/O, USB 5V Tolerant Pins:
(USB0_DM, USB0_DP)
Output voltage ranges
V_O I/O, 3.3V
(Steady State)
V_O I/O, 3.3V
(Transient Overshoot/Undershoot)
Clamp Current
Input or Output Voltages 0.3V above or below their respective power
rails. Limit clamp current that flows through the I/O's internal diode
protection cells.
Storage temperature range, T_stg
Operating Junction Temperature ranges,
T_J
ESD Stress Voltage, V_ESD(4)
(default)
Commercial (default)
Industrial (D version)
Extended (A version)
Human Body Model (HBM)⁽⁵⁾
Charged Device Model (CDM)⁽⁶⁾
-0.5 V to 1.4 V
-0.5 V to 2 V
-0.5 V to 3.8V
-0.3 V to CVDD + 0.3V
-0.3V to DVDD + 0.35V
DVDD + 20%
up to 20% of Signal
Period
5.25V ⁽³⁾
-0.5 V to DVDD + 0.3V
20% of DVDD for up to
20% of the signal period
±20mA
-55°C to 150°C
0°C to 90°C
-40°C to 90°C
-40°C to 105°C
>2000V
>500V
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to VSS, PLL0_VSSA, OSCVSS
(3) Up to a max of 24 hours.
(4) Electrostatic discharge (ESD) to measure device sensitivity/immunity to damage caused by electrostatic discharges into the device.
(5) Level listed above is the passing level per ANSI/ESDA/JEDEC JS-001-2010. JEDEC document JEP155 states that 500V HBM allows
safe manufacturing with a standard ESD control process, and manufacturing with less than 500V HBM is possible if necessary
precautions are taken. Pins listed as 1000V may actually have higher performance.
(6) Level listed above is the passing level per EIA-JEDEC JESD22-C101E. JEDEC document JEP157 states that 250V CDM allows safe
manufacturing with a standard ESD control process. Pins listed as 250V may actually have higher performance.
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Device Operating Conditions
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