TH58100FT Datasheet, PDF (25/43 Pages) Toshiba Semiconductor – TENTATIVE TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS

TH58100FT
Status Read
The device has two Status Read commands. One is Status Read (1) command “70H” and the other is Status
Read (2) command “71H”.
The device automatically implements the execution and verification of the Program and Erase operations. The
Status Read function is used to monitor the Ready/Busy status of the device, determine the result (pass/fail) of a
Program or Erase operation, and determine whether the device is in Protect mode. The device status is output
via the I/O port on the RE clock after a Status Read command “70H” or “71H” input.
The resulting information of Status Read (1) command “70H” is outlined in Table 5 below and the resulting
information of Status Read (2) command “71H” is outlined in the explanation for Multi Block Program and Multi
Block Erase toward the end of this document.
Table 5. Status output table for Status Read (1) command “70H”
STATUS
OUTPUT
I/O1
Pass/Fail
Pass: 0
Fail: 1
I/O2
Not Used
0
I/O3
Not Used
0
I/O4
Not Used
0
I/O5
Not Used
0
I/O6
Not Used
0
I/O7
Ready/Busy
Ready: 1
Busy: 0
I/O8
Write Protect
Protect: 0
Not Protected: 1
An application example with multiple devices is shown in Figure 6.
CE1
CE2
CE3
The Pass/Fail status on I/O1 is only
valid when the device is in the Ready
state.
CEN
CEN + 1
CLE
ALE
WE
RE
I/O1
to I/O8
RY/BY
Device
1
Device
2
Device
3
Device
N
Device
N+1
RY/BY
Busy
CLE
ALE
WE
CE1
CEN
RE
I/O
70H
70H
Status on Device 1
Status on Device N
Figure 6. Status Read timing application example
System Design Note: If the RY/BY pin signals from multiple devices are wired together as shown in the
diagram, the Status Read function can be used to determine the status of each individual device.
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