LP2975 Datasheet, PDF (3/37 Pages) National Semiconductor (TI) – MOSFET LDO Driver/Controller

LP2975
www.ti.com
SNVS006F – SEPTEMBER 1997 – REVISED APRIL 2013
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
Storage Temperature Range
Lead Temp. (Soldering, 5 seconds)
ESD Rating
Power Dissipation ⁽²⁾
Input Supply Voltage (Survival)
Current Limit Pins (Survival)
Comp Pin (Survival)
Gate Pin (Survival)
ON/OFF Pin (Survival)
Feedback Pin (Survival)
−65°C to +150°C
260°C
2 kV
Internally Limited
−0.3V to +26V
−0.3V to +V_IN
−0.3V to +2V
−0.3V to +V_IN
−0.3V to +20V
−0.3V to +24V
(1) Absolute Maximum Ratings indicate limits beyond which damage to the component may occur. Electrical specifications do not apply
when operating the device outside of its rated operating conditions.
(2) The LP2975 has internal thermal shutdown which activates at a die temperature of about 150°C. It should be noted that the power
dissipated within the LP2975 is low enough that this protection circuit should never activate due to self-heating, even at elevated
ambient temperatures.
OPERATING RATINGS
Junction Temperature, T_J
Input Supply Voltage, V_IN
−40°C to +125°C
+1.8V to +24V
ELECTRICAL CHARACTERISTICS
Limits in standard typeface are for T_J = 25°C, and limits in boldface type apply over the full operating junction temperature
range. Unless otherwise specified: V_ON/OFF = 1.5V, V_IN = 15V.
Symbol
Parameter
Conditions
LM2975AI-X.X
LM2975I-X.X
Typ
(1)
(1)
Units
Min
Max
Min
Max
V_REG
V_COMP
Regulation Voltage
(12V Versions)
Regulation Voltage
(5V Versions)
Regulation Voltage
(3.3V Versions)
Comp Pin Voltage
12.5 < V_IN < 24V
(V_IN - 0.5V) > V_GATE > (V_IN - 5V)
5.5 < V_IN < 24V
(V_IN - 0.5V) > V_GATE > (V_IN - 4.5V)
3.8 < V_IN < 24V
(V_IN - 0.5V) > V_GATE > (V_IN - 3.3V)
V_REG < V_IN < 24V
12.0
11.820 12.180 11.700 12.300
11.640 12.360 11.520 12.480
5.0
4.925
4.850
5.075
5.150
4.875
4.800
5.125
5.200
V
3.3
3.250
3.201
3.350
3.399
3.217
3.168
3.383
3.432
1.240
1.215
1.209
1.265
1.271
1.203
1.196
1.277
1.284
V
I_Q
Quiescent Current
V_CL
Current Limit
Sense Voltage
V_ON/OFF ON/OFF Threshold
V_IN = 5V
V_ON/OFF = 0V
V_IN = 15V
V_FB = 0.9 X V_REG
Output = ON
Output = OFF
180
240
320
240
320
µA
0.01
1
1
57
45
39
69
72
45
39
69
72
mV
0.94
1.10
1.20
1.10
1.20
V
0.87
0.70
0.40
0.70
0.40
I_ON/OFF
ON/OFF
Input Bias Current
V_ON/OFF = 1.5V
34
50
75
50
75
µA
Gate Drive Current
V_G = 7.5V
I_G
(Sourcing)
Gate Drive Current
V_FB = 1.1 X V_REG
V_G = 7.5V
(Sinking)
V_FB = 0.9 X V_REG
3.5
1.3
0.3
1.3
0.3
mA
1100
350
40
350
40
µA
(1) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation using
Statistical Quality Control (SQC) methods. The limits are used to calculate TI's Average Outgoing Quality Level (AOQL).
Copyright © 1997–2013, Texas Instruments Incorporated
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