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LMF100_15 Datasheet, PDF (5/40 Pages) Texas Instruments – LMF100 Dual High-Performance Switched Capacitor Filters
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LMF100
SNOSBG9B – JULY 1999 – REVISED JUNE 2015
6.4 Thermal Information
THERMAL METRIC(1)
LMF100
DW (SOIC)
N (PDIP)
UNIT
20 PINS
20 PINS
RθJA
RθJC(top)
RθJB
ψJT
ψJB
RθJC(bot)
Junction-to-ambient thermal resistance
Junction-to-case (top) thermal resistance
Junction-to-board thermal resistance
Junction-to-top characterization parameter
Junction-to-board characterization parameter
Junction-to-case (bottom) thermal resistance
63.8
49.5
°C/W
27.2
41.1
°C/W
31.8
30.4
°C/W
5.7
18.3
°C/W
31.3
30.3
°C/W
—
—
°C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
6.5 Electrical Characteristics for V+ = +5 V and V− = −5 V
The following specifications apply for Mode 1, Q = 10 (R1 = R3 = 100 k, R2 = 10 k), V+ = +5 V and V− = −5 V unless otherwise
specified. All limits are TA = TJ = 25°C unless otherwise specified.
PARAMETER
TEST CONDITIONS
LMF100CCN
MIN
TYP
MAX
LMF100CIWM
MIN
TYP
MAX
UNIT
9
9
Is
Maximum supply current
fCLK = 250 kHz,
No Input Signal
Tested
Limit (1)
Design
Limit (2)
TMIN to TMAX
TMIN to TMAX
13
13 mA
13
f0
Center frequency
0.1
10000
0
0.1
100000 Hz
fCLK Clock frequency
5
35000
00
5
3500000 Hz
±0.2%
±0.2%
fCLK/f Clock to center frequency ratio
0
deviation
VPin12 = 5 V or 0
V, fCLK = 1 MHz
Tested
Limit(1)
Design
Limit(2)
TMIN to TMAX
TMIN to TMAX
±0.8%
±0.8%
±0.8%
DQ
Q Error (MAX) (3)
Q
Q = 10, Mode 1,
VPin12 = 5 V or 0
V,
fCLK = 1 MHz
Tested
Limit(1)
Design
Limit(2)
TMIN to TMAX
TMIN to TMAX
±0.5%
±5%
±6%
±0.5%
±6%
0
0
HOBP Bandpass gain at f0
fCLK = 1 MHz
Tested
Limit(1)
Design
Limit(2)
TMIN to TMAX
TMIN to TMAX
±0.4
±0.4 dB
±0.4
0
0
HOLP DC Lowpass gain
R1 = R2 = 10 k,
fCLK = 250 kHz
Tested
Limit(1)
Design
Limit(2)
TMIN to TMAX
TMIN to TMAX
±0.2
±0.2 dB
±0.2
±5
±5
VOS1 DC Offset voltage(4)
fCLK = 250 kHz
Tested
Limit(1)
Design
Limit(2)
TMIN to TMAX
TMIN to TMAX
±15
±15 mV
±15
(1) Tested limits are specified to Texas Instruments AOQL (Average Outgoing Quality Level).
(2) Design limits are specified to Texas Instruments AOQL (Average Outgoing Quality Level) but are not 100% tested.
(3) The accuracy of the Q value is a function of the center frequency (f0). This is illustrated in the curves under the heading Typical
Characteristics.
(4) Vos1, Vos2, and Vos3 refer to the internal offsets as discussed in Application Information.
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