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HAT3010R Datasheet, PDF (6/16 Pages) Renesas Technology Corp – Silicon N/P Channel Power MOS FET High Speed Power Switching
HAT3010R
• P Channel
Item
Symbol Min
Drain to source breakdown
voltage
V(BR)DSS
–60
Gate to source breakdown
voltage
V
(BR)GSS
±20
Gate to source leak current
Zero gate voltage drain current
Gate to source cutoff voltage
Static drain to source on state
resistance
Forward transfer admittance
Input capacitance
IGSS
IDSS
VGS(off)
RDS(on)
RDS(on)
|yfs|
Ciss
—
—
–1.0
—
—
3
—
Output capacitance
Coss —
Reverse transfer capacitance
Crss —
Turn-on delay time
td(on)
—
Rise time
tr
—
Turn-off delay time
td(off)
—
Fall time
t
—
f
Body–drain diode forward voltage V
—
DF
Body–drain diode reverse
recovery time
trr
—
Notes: 5. Pulse test
Typ Max Unit
—
—
V
—
—
V
—
±10 µA
—
–1
µA
—
–2.5 V
60
76
mΩ
90
130 mΩ
5
—
S
1350 —
pF
135 —
pF
85
—
pF
20
—
ns
15
—
ns
55
—
ns
10
—
ns
-0.85 -1.10 V
50
—
ns
Test Conditions
ID = –10 mA, VGS = 0
I
G
=
±100
µA,
V
DS
=
0
VGS = ±16 V, VDS = 0
VDS = –60 V, VGS = 0
VDS = –10 V, I D = –1 mA
ID = –2.5 A, VGS = –10 V Note5
ID = –2.5 A, VGS = – 4.5 V Note5
ID = –2.5 A, VDS = –10 V Note5
VDS = –10 V
V =0
GS
f = 1 MHz
VGS = –10 V, ID = –2.5 A
VDD ≈ –30 V
RL = 12 Ω
R
g
=
4.7
Ω
IF = –5 A, V = 0 Note5
GS
IF = –5 A, VGS = 0
diF/ dt = 100 A/µs
Rev.8, Aug. 2002, page 4 of 14