PLC42VA12 Datasheet, PDF (5/20 Pages) NXP Semiconductors – CMOS programmable multi-function PLD 42 × 105 × 12

Philips Semiconductors Programmable Logic Devices
CMOS programmable multi-function PLD
(42 × 105 × 12)
Product specification
PLC42VA12
ABSOLUTE MAXIMUM RATINGS¹
SYMBOL
PARAMETER
RATINGS
UNIT
V_CC
Supply voltage
–0.5 to +7
V_DC
V_IN
Input voltage
–0.5 to V_CC +0.5
V_DC
V_OUT
Output voltage
–0.5 to V_CC +0.5
V_DC
I_IN
Input currents
–10 to +10
mA
I_OUT
Output currents
+24
mA
T_amb
Operating temperature range
0 to +75
°C
T_stg
Storage temperature range
–65 to +150
°C
NOTE:
1. Stresses above those listed may cause malfunction or permanent damage to the device. This
is a stress rating only. Functional operation at these or any other condition above those
indicated in the operational and programming specification of the device is not implied.
THERMAL RATINGS
TEMPERATURE
Maximum junction
Maximum ambient
Allowable thermal
rise ambient to
junction
150°C
75°C
75°C
AC TEST CONDITIONS
C₁
C₂
INPUTS
V_CC
+5V
S₁
OE
I_n
M_Z
I_n
DUT
B_M
B_M
M_Z
CK ^GND
R₁
R₂
C_L
OUTPUTS
NOTE:
C₁ and C₂ are to bypass V_CC to GND.
Test Load Circuit
VOLTAGE WAVEFORMS
+3.0V
90%
0V
+3.0V
10%
5ns
t_R t_F
5ns
90%
0V
5ns
10%
5ns
MEASUREMENTS:
All circuit delays are measured at the +1.5V level
of inputs and outputs, unless otherwise specified.
Input Pulses
October 22, 1993
77