PALLV22V10 Datasheet, PDF (8/19 Pages) Lattice Semiconductor – Low-Voltage Zero Power 24-Pin EE CMOS Versatile PAL Device

ABSOLUTE MAXIMUM RATINGS
OPERATING RANGES
Storage Temperature . . . . . . . . . . . . . .-65°C to +150°C
Ambient Temperature with
Power Applied . . . . . . . . . . . . . . . . . .-55°C to +125°C
Supply Voltage with
Respect to Ground . . . . . . . . . . . . . . . -0.5 V to +7.0 V
DC Input Voltage . . . . . . . . . . . . . . . -0.5 V to +5.25 V
Commercial (C) Devices
Ambient Temperature (T_A) . . . . . . . . . . . 0°C to +75°C
Supply Voltage (V_CC) with
Respect to Ground. . . . . . . . . . . . . . . +3.0 V to +3.6 V
Industrial (I) Devices
DC Output or I/O Pin Voltage . . . . . . -0.5 V to +5.25 V
Ambient Temperature (T_A) . . . . . . . . . . -40°C to +85°C
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Supply Voltage (V_CC) with
Latchup Current (T_A = 0°C to +75°C) . . . . . . . . 100 mA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum Rat-
ings for extended periods may affect device reliability. Pro-
gramming conditions may differ.
Respect to Ground. . . . . . . . . . . . . . . +3.0 V to +3.6 V
Operating ranges define those limits between which the func-
FOR ^{tionality of the device is guaranteed.}
S _{DC CHARACTERISTICS OVER COMMERCIAL AND INDUSTRIAL OPERATING}
E _{S RANGES}
IC _{N Parameter}
V ^Symbol
DE ^{SIG VOH}
Parameter Description
Output HIGH Voltage
V_IN = V_IH or V_IL
V_CC = Min
Test Conditions
Min Max Unit
I_OH = -2 mA
2.4
V
I_OH = -100 µA V_CC -0.2
V
L _{DE VOL}
Output LOW Voltage
GA ^{W VIH}
Input HIGH Voltage
V_IN = V_IH or V_IL
Guaranteed Input Logical HIGH
Voltage for all Inputs (Notes 1, 2)
I_OL = 16 mA
I_OL = 100 µA
0.5
V
0.2
V
2.0
5.25
V
E ^{E V}_IL
Input LOW Voltage
Guaranteed Input Logical LOW
Voltage for all Inputs (Notes 1, 2)
0.8
V
S ^N _IIH
Input HIGH Leakage Current
V_IN = V_CC, V_CC = Max (Note 2)
U I_IL
Input LOW Leakage Current
V_IN = 0 V, V_CC = Max (Note 2)
10
µA
-100 µA
Off-State Output Leakage
I_OZH
Current HIGH
V_OUT = V_CC, V_CC = Max
V_IN = V_IH or V_IL (Note 2)
10
µA
Off-State Output Leakage
I_OZL
Current LOW
V_OUT = 0 V, V_CC = Max
V_IN = V_IH or V_IL (Note 2)
-100 µA
I_SC
Output Short-Circuit Current
V_OUT = 0.5 V, V_CC = Max (Note 3)
-5
-75 mA
I_CC (Static)
Supply Current
Outputs f = 0 MHz, Open
(I_OUT = 0 mA)
-10/15 Commercial
-7
-15 Industrial
60 mA
75 mA
75 mA
Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of I_IL and I_OZL (or I_IH and I_OZH).
3. Not more than one output should be shorted at a time and duration of the short-circuit should not exceed one second.
V_OUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
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PALLV22V10 - 7/10/15 (Com’l), -15 (Ind’l)