PALLV22V10 Datasheet, PDF (10/19 Pages) Lattice Semiconductor – Low-Voltage Zero Power 24-Pin EE CMOS Versatile PAL Device

ABSOLUTE MAXIMUM RATINGS
OPERATING RANGES
Storage Temperature . . . . . . . . . . . . . .-65°C to +150°C
Ambient Temperature with
Power Applied . . . . . . . . . . . . . . . . . .-55°C to +125°C
Supply Voltage with
Respect to Ground . . . . . . . . . . . . . . . -0.5 V to +7.0 V
DC Input Voltage . . . . . . . . . . . . . . . . -0.5 V to +5.5 V
DC Output or I/O Pin Voltage . . . . . . . -0.5 V to +5.5 V
Industrial (I) Devices
Ambient Temperature (T_A) . . . . . . . . . . -40°C to +85°C
Supply Voltage (V_CC) with
Respect to Ground. . . . . . . . . . . . . . . +3.0 V to +3.6 V
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Latchup Current (T_A = -40°C to 85°C). . . . . . . . 100 mA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum Rat-
ings for extended periods may affect device reliability. Pro-
gramming conditions may differ.
FOR
S _{DC CHARACTERISTICS OVER INDUSTRIAL OPERATING RANGES}
E _{S Parameter}
IC ^Symbol
Parameter Description
EV ^{IGN VOH}
Output HIGH Voltage
D ^{S VOL}
Output LOW Voltage
L _{DE VIH}
Input HIGH Voltage
A _VIL
Input LOW Voltage
G _{EW IIH}
Input HIGH Leakage Current
E _IIL
Input LOW Leakage Current
S ^N _{Off-State Output Leakage}
U ^IOZH
Current HIGH
Test Conditions
V_IN = V_IH or V_IL
V_CC = Min
V_IN = V_IH or V_IL
V_CC = Min
Guaranteed Input Logical HIGH
Voltage for all Inputs (Note 1)
Guaranteed Input Logical LOW
Voltage for all Inputs (Note 1)
V_IN = V_CC, V_CC = Max
V_IN = 0 V, V_CC = Max
V_OUT = V_CC, V_CC = Max
V_IN = V_IH or V_IL (Note 2)
I_OH = -2 mA
I_OH = -100 µA
I_OL = 2 mA
I_OL = 100 µA
Min
2.4
V_CC -0.3
2.0
Max
0.4
0.2
5.5
0.8
10
-10
10
Unit
V
V
V
V
V
V
µA
µA
µA
Off-State Output Leakage
I_OZL
Current LOW
V_OUT = 0 V, V_CC = Max
V_IN = V_IH or V_IL (Note 2)
-10 µA
I_SC
Output Short-Circuit Current
V_OUT = 0.5 V, V_CC = Max (Note 3)
-5
-75 mA
I_CC
Supply Current
Outputs Open (I_OUT = 0 mA)
V_CC = Max (Note 4)
f = 0 MHz
f = 15 MHz
30
µA
55 mA
Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of I_IL and I_OZL (or I_IH and I_OZH).
3. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second.
V_OUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
4. This parameter is guaranteed under worst case test conditions. Refer to the I_CC vs. Frequency graph in this datasheet for typical
I_CC characteristics.
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