E1976A Datasheet, PDF (5/37 Pages) Keysight Technologies – E1966A 1xEV-DO Terminal Test Application

05 | Keysight | E1966A 1xEV-DO Terminal Test Application - Technical Overview
E1966A Functionality Overview (Continued)
Option 405 – Fading tests
E5515C/E Option 004 adds a rear panel digital bus that enables fading when it is used
with Keysight’s Baseband Studio for fading solution. The E1966A provides receiver
fading tests with unprecedented accuracy and repeatability, at a very attractive price
point. Baseband I/Q data from the Keysight E5515C/E wireless communications test
set is sent via the digital bus to the N5106A. The N5106A (PXB) software configures the
user-selected fading profile. After digital fading, AWGN can be digitally added to the
waveform. The resulting waveform is then returned to the test set via the digital bus
for modulation. This solution eliminates almost all associated calibrations and provides
rock-solid repeatability
Option 406 – Multi-unit synchronization
Option 406 allows any test set to be time-synchronized to another test set that is
running either a CDMA or 1xEV-DO test application or lab application. The multi-unit
synchronization supports simulation of mobile behaviors with two base stations.
Typical applications are idle/softer handoff, pilot detection, and hybrid mode simulation.
Option 407 – Protocol logging
Option 407 provides extensive logging of messages at the air interface signaling layer,
PPP layer, and IP layer in both the forward and reverse directions, and an output
protocol stream to external PC software, Wireless Protocol Advisor. This information
is useful for debugging manufacturing test flow and identifying problems.
1xEV-DO test mode support
Receiver test without active call processing is supported in the E1966A 1xEV-DO
test application through the IS-856 test mode. In test mode, the E1966A provides an
accurate 1xEV-DO Release 0 forward link signal that allows access terminals supporting
test mode operation to achieve time alignment. At this point, the AT can be directed to
demodulate the forward traffic channel that is continuously transmitted by the test set.
The packet error rate of the AT can then be read from the AT using the AT’s test mode
control software. In addition, AT transmitter measurements such as channel power,
Tx spurious emissions, waveform quality, code domain power, and time response of
open loop power can be made in test mode.
Easy upgrade for existing CDMA-capable 8960 Series 10 test sets
Units that support the CDMA test applications, like the E1962B, are easily upgraded
to 1xEV-DO test capabilities. It’s a simple firmware upgrade with no hardware require-
ments. Option 102 (1xEV-DO Release A support) does require a hardware upgrade for
E5515Cs with serial prefix less than GB4604xxxxxx. Units with hardware that supports
Option 102 do not require further hardware upgrades to support the Option 103
multi-carrier capability.