E1976A Datasheet, PDF (28/37 Pages) Keysight Technologies – E1966A 1xEV-DO Terminal Test Application

28 | Keysight | E1966A 1xEV-DO Terminal Test Application - Technical Overview
1xEV-DO Analyzer (Continued)
Tx spurious emissions
Input frequency ranges
Measurement data
capture period
Measurement trigger
Maximum input level
Measurement range
Measurement level ranging
Concurrency capabilities
411 to 420 MHz
450 to 484 MHz
821 to 934 MHz
1700 to 1980 MHz
5 ms
1.67 ms (slot trigger)
+37 dBm/1.23 MHz peak (5 W peak)
0 to +30 dBm
Auto
Tx spurious emissions measurements can be made concurrently with all
1xEV-DO measurements that support concurrency
Tx spurious emissions Test Case 1 (for one carrier)
Measurement method
Measures the active carrier power in a 1.23 MHz bandwidth, then
measures the power in a 30 kHz bandwidth at two offsets above and
below the active carrier and displays the ratio of the offset powers to
the active carrier power in dBc
Measurement offsets
Frequencies < 1000 MHz
Frequencies > 1000 MHz
±885 kHz, ±1.98 MHz
±1.25 MHz, ±1.98 MHz
Measurement bandwidth
Active carrier
Offsets
Marker relative level accuracy
±885 kHz, ±1.25 MHz offsets
±1.98 MHz offsets
1.23 MHz
30 kHz synchronously tuned, five pole filter with approximately
Gaussian shape
< ±0.4 dB, typically < ±0.2 dB
< ±0.8 dB, typically < ±0.5 dB
Measurement residual relative power
±885 kHz, ±1.25 MHz offsets
±1.98 MHz offsets
< −62 dBc/30 kHz BW
< −66 dBc/30 kHz BW
Mobile pass/fail limits (per C.S0033)
Auto mode
–– Frequencies
< 1000 MHz
−42 dBc/30 kHz for ±885 kHz offsets
−54 dBc/30 kHz for ±1.98 MHz offsets
–– Frequencies
> 1000 MHz
−42 dBc/30 kHz for ±1.25 MHz offsets
−50 dBc/30 kHz for ±1.98 MHz offsets
Manual mode
Numeric results
Settable from −10 to −65 dBc with 0.01 dB resolution
Relative power in dBc/30 kHz for each of the four offset frequencies