4082A Datasheet, PDF (20/21 Pages) Keysight Technologies – Parametric Test System

20 | Keysight | 4082A Parametric Test System - Data Sheet
Recommended Conditions for Ultra-Low Current and Low Voltage
Measurements¹
In addition to the conditions listed in general speciications, Keysight Technologies recommends that the following additional
conditions be satisied for measuring precise low current and low voltage with the 4082A.
Recommended conditions for ultra-low current and low voltage measurements
Probe cards²
JEM and MJC
Temperature
Temperature change period
Humidity
Warm up time
Floor vibration
Floor vibration frequency
Air cleanliness
Line voltage
Within ±1°C after calibration
≥ 10 minutes
≤ 50%
≥ 60 minutes
≤ 1 mG
≥ 10 Hz
≤ class 10,000
Burst noise ≤ 1 kV
Surge noise ≤ 1 kV
This line voltage environment applies EN61326–1
1. The information is this section applies only to systems conigured with ultra-low current matrix cards and a high-resolution SMU.
2. Please contact your local sales representative regarding the latest information on recommended probers and probe cards.