XC2269I Datasheet, PDF (90/134 Pages) Infineon Technologies AG – 16/32-Bit Single-Chip Microcontroller

XC2269I
XC2000 Family Derivatives / Premium Line
Electrical Parameters
1) These parameter values cover the complete operating range. Under relaxed operating conditions (room
temperature, nominal supply voltage) the typical values can be used for calculation.
2) The sum of DNL/INL/GAIN/OFF errors does not exceed the related TUE total unadjusted error.
3) If a reduced analog reference voltage between 1 V and V_DDPA / 2 is used, there is an additional decrease of
the ADC speed and accuracy.
4) If the analog reference voltage is below V_DDPA but still in the range of V_DDPA / 2 and V_DDPA, the ADC errors
increase. Reducing the reference voltage by a factor k (k < 1) increases TUE, DNL, INL, Gain and Offset errors
by a factor 1/k.
5) If the analog reference voltage is above V_DDPA, the ADC errors increase.
6) TUE is based on 12-bit conversions.
TUE is tested at V_AREF = V_DDPA = 5.0 V, V_AGND = 0 V. It is verified by design for all other voltages within the
defined voltage range. The specified TUE is valid only if the absolute sum of input overload currents on analog
port pins (see I_OV specification) does not exceed 10 mA, and if V_AREF and V_AGND remain stable during the
measurement time.
Table 22 ADC Parameters for Lower Voltage Range
Parameter
Symbol
Values
Min. Typ. Max.
Input resistance of the
R_AIN CC −
selected analog channel
1.4 2.5
Input resistance of the
reference input
R_AREF
−
CC
0.8 1.7
Differential Non-Linearity |EA_DNL| −
Error ^2)3)4)5)
CC
Gain Error ^2)3)4)5)
|EA_GAIN| −
CC
Integral Non-Linearity
2)3)4)5)
|EA_INL| −
CC
Offset Error ^2)3)4)5)
|EA_OFF| −
CC
Total Unadjusted Error ³⁾⁴⁾ |TUE| −
CC
Analog clock frequency f_ADCI SR 2
2
1.5 3.0
0.5 3.5
1.5 3.0
1.0 4.0
2.5 4
−
16.7
−
12.1
Unit Note /
Test Condition
kΩ not subject to
production test
1)
kΩ not subject to
production test
1)
LSB not subject to
production test
LSB not subject to
production test
LSB not subject to
production test
LSB not subject to
production test
LSB ⁶⁾
MHz
MHz
Std. reference
input (V_AREF)
Alt. reference
input (CH0)
Data Sheet
90
V1.3, 2014-07