XC2269I Datasheet, PDF (89/134 Pages) Infineon Technologies AG – 16/32-Bit Single-Chip Microcontroller

XC2269I
XC2000 Family Derivatives / Premium Line
Electrical Parameters
2) This parameter includes the sample time (also the additional sample time specified by STC), the time to
determine the digital result and the time to load the result register with the conversion result. Values for the
basic clock t_ADCI depend on programming.
3) The broken wire detection delay against V_AGND is measured in numbers of consecutive precharge cycles at a
conversion rate of not more than 500 µs. Result below 10% (66_H).
4) The broken wire detection delay against V_AREF is measured in numbers of consecutive precharge cycles at a
conversion rate of not more than 10 µs. This function is influenced by leakage current, in particular at high
temperature. Result above 80% (332_H).
5) V_AIN may exceed V_AGND or V_AREF up to the absolute maximum ratings. However, the conversion result in these
cases will be X000_H or X3FF_H, respectively.
Table 21 ADC Parameters for Upper Voltage Range
Parameter
Symbol
Values
Min. Typ. Max.
Input resistance of the
R_AIN CC −
selected analog channel
0.9 1.5
Input resistance of the
reference input
R_AREF
−
CC
0.5 1
Differential Non-Linearity |EA_DNL| −
Error ^2)3)4)5)
CC
Gain Error ^2)3)4)5)
|EA_GAIN| −
CC
Integral Non-Linearity
2)3)4)5)
|EA_INL| −
CC
Offset Error ^2)3)4)5)
|EA_OFF| −
CC
Total Unadjusted Error ³⁾⁴⁾ |TUE| −
CC
Analog clock frequency f_ADCI SR 2
2
1.5 3.0
0.5 3.5
1.5 3.0
1.0 4.0
2.5 4
−
20
−
17.5
Wakeup time from analog t_WAF CC −
−
7
powerdown, fast mode
Wakeup time from analog t_WAS CC −
−
11.5
powerdown, slow mode
Unit Note /
Test Condition
kΩ not subject to
production test
1)
kΩ not subject to
production test
1)
LSB not subject to
production test
LSB not subject to
production test
LSB not subject to
production test
LSB not subject to
production test
LSB ⁶⁾
MHz
MHz
Std. reference
input (V_AREF)
Alt. reference
input (CH0)
μs
μs
Data Sheet
89
V1.3, 2014-07