TC1736 Datasheet, PDF (57/123 Pages) Infineon Technologies AG – 32-Bit Single-Chip Microcontroller

TC1736
Introduction
2.6.5 Self-Test Support
Some manufacturing tests can be invoked by the application (e.g. after power-on) if
needed:
• Hardware-accelerated checksum calculation (e.g. for Flash content).
2.6.6 FAR Support
To efficiently locate and identify faults after integration of a TC1736 into a system special
functions are available:
• Boundary Scan (IEEE 1149.1) via JTAG and DAP.
• SSCM (Single Scan Chain Mode¹⁾) for structural scan testing of the chip itself.
1) This function requires access to some device pins (e.g. TESTMODE) in addition to those needed for OCDS.
Data Sheet
53
V1.1, 2009-08