HY29LV320 Datasheet, PDF (32/44 Pages) Hynix Semiconductor – 32 Mbit (2M x 16) Low Voltage Flash Memory

HY29LV320
AC CHARACTERISTICS
Read Operations
Parameter
JEDEC Std
t_AVAV
t_RC
Description
Read Cycle Time ¹
t_AVQV
t_ACC Address to Output Delay
t_ELQV
t_EHQZ
t_GLQV
t_GHQZ
t_CE Chip Enable to Output Delay
t_DF Chip Enable to Output High Z ¹
t_OE Output Enable to Output Delay
t_DF Output Enable to Output High Z ¹
t_OEH
Output Enable
Hold Time ¹
Read
Toggle and
Data# Polling
t_AXQX
t_OH
Output Hold Time from Addresses, CE#
or OE#, Whichever Occurs First ¹
Notes:
1. Not 100% tested.
2. See Figure 15 and Table 15 for test conditions.
Test Setup
Speed Option
Unit
- 70 - 80 - 90 - 12
Min 70 80 90 120 ns
CE# = V_IL
OE# = V_IL
Max
70
80
OE# = V_IL Max 70 80
Max 25 25
90 120 ns
90 120 ns
30 30 ns
CE# = V_IL Max 30 30 35 50 ns
Max 25 30 30 30 ns
Min
0
ns
Min
10
ns
Min
0
ns
Addresses
CE#
t_RC
Addresses Stable
t_ACC
OE#
WE#
Outputs
t_OE
t_OEH
t_DF
t_CE
t_OH
Output Valid
RESET#
RY/BY#
0V
32
Figure 17. Read Operation Timings
r1.3/May 02