MC9S08SG32 Datasheet, PDF (322/328 Pages) Freescale Semiconductor, Inc – HCS08 Microcontrollers

Appendix A Electrical Characteristics
A.14 EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external
components as well as MCU software operation all play a significant role in EMC performance. The
system designer should consult Freescale applications notes such as AN2321, AN1050, AN1263,
AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.
A.14.1 Radiated Emissions
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell
method in accordance with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed
with the microcontroller installed on a custom EMC evaluation board while running specialized EMC test
software. The radiated emissions from the microcontroller are measured in a TEM cell in two package
orientations (North and East).
The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal
to the reported emissions levels.
Table A-17. Radiated Emissions, Electric Field
Parameter
Symbol Conditions
Frequency
f_OSC/f_BUS
Level¹
(Max)
Temp
Rated
Unit
0.15 – 50 MHz
12
50 – 150 MHz
12
Radiated emissions,
electric field
V_{RE_TEM}
V_DD = 5 V
T_A = +25^oC
package type
28 TSSOP
150 – 500 MHz _{4 MHz crystal}
20 MHz bus
500 – 1000 MHz
6
–8
IEC Level²
N
SAE Level³
2
1 _{Data based on qualification test results.}
2 _{IEC Level Maximums: N ≤ 12dBμV, L ≤ 24dBμV, I ≤ 36dBμV}
3 _{SAE Level Maximums: 1 ≤ 10dBμV, 2 ≤ 20dBμV, 3 ≤ 30dBμV, 4 ≤ 40dBμV}
♦♦
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dBμV
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MC9S08SG32 Data Sheet, Rev. 7
322
Freescale Semiconductor