33912 Datasheet, PDF (17/47 Pages) Freescale Semiconductor, Inc – LIN System Basis Chip with DC Motor Pre-driver and Current

ELECTRICAL CHARACTERISTICS
TIMING DIAGRAMS
TIMING DIAGRAMS
33912
LIN
PGND LGND AGND
1.0nF
TRANSIENT PULSE
GENERATOR
(NOTE)
GND
Note Waveform per ISO 7637-2. Test Pulses 1, 2, 3a, 3b.
Figure 4. Test Circuit for Transient Test Pulses (LIN)
33912
L1, L2, L3, L4
1.0 nF
10 kΩ
PGND LGND AGND
Transient Pulse
Generator
(Note)
GND
Note Waveform per ISO 7637-2. Test Pulses 1, 2, 3a, 3b,.
Figure 5. Test Circuit for Transient Test Pulses (Lx)
V_SUP
TXD
RXD
R0
LIN
R0 AND C0 COMBINATIONS:
• 1.0KΩ and 1.0nF
C0
• 660Ω and 6.8nF
• 500Ω and 10nF
Figure 6. Test Circuit for LIN Timing Measurements
Analog Integrated Circuit Device Data
Freescale Semiconductor
33912
17