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MC9S12DP512CPVE Datasheet, PDF (119/124 Pages) Freescale Semiconductor, Inc – MC9S12DP512 Device Guide V01.25
MC9S12DP512 Device Guide V01.25
Table A-21 Expanded Bus Timing Characteristics
Conditions are shown in Table A-4 unless otherwise noted, CLOAD = 50pF
Num C
Rating
Symbol Min
1 P Frequency of operation (E-clock)
fo
0
2 P Cycle time
tcyc
40
3 D Pulse width, E low
PWEL
19
4 D Pulse width, E high1
PWEH
19
5 D Address delay time
tAD
-
6 D Address valid time to E rise (PWEL–tAD)
tAV
11
7 D Muxed address hold time
tMAH
2
8 D Address hold to data valid
tAHDS
7
9 D Data hold to address
tDHA
2
10 D Read data setup time
tDSR
13
11 D Read data hold time
tDHR
0
12 D Write data delay time
tDDW
-
13 D Write data hold time
tDHW
2
14 D Write data setup time(1) (PWEH–tDDW)
tDSW
12
15 D Address access time(1) (tcyc–tAD–tDSR)
tACCA
19
16 D E high access time(1) (PWEH–tDSR)
tACCE
6
17 D Non-multiplexed address delay time
tNAD
-
18 D Non-muxed address valid to E rise (PWEL–tNAD)
tNAV
13
19 D Non-multiplexed address hold time
tNAH
2
20 D Chip select delay time
tCSD
-
21 D Chip select access time(1) (tcyc–tCSD–tDSR)
tACCS
11
22 D Chip select hold time
tCSH
2
23 D Chip select negated time
tCSN
8
24 D Read/write delay time
tRWD
-
25 D Read/write valid time to E rise (PWEL–tRWD)
tRWV
14
26 D Read/write hold time
tRWH
2
27 D Low strobe delay time
tLSD
-
28 D Low strobe valid time to E rise (PWEL–tLSD)
tLSV
14
29 D Low strobe hold time
tLSH
2
30 D NOACC strobe delay time
tNOD
-
31 D NOACC valid time to E rise (PWEL–tNOD)
tNOV
14
Typ
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
Max
25.0
-
-
-
8
-
-
-
-
-
-
7
-
-
-
-
6
-
-
16
-
-
-
7
-
-
7
-
-
7
-
Unit
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
119