MC9S12DP512CPVE Datasheet, PDF (101/124 Pages) Freescale Semiconductor, Inc – MC9S12DP512 Device Guide V01.25

MC9S12DP512 Device Guide V01.25
A.3.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed
Table A-12 NVM Reliability Characteristics¹
Conditions are shown in Table A-4 unless otherwise noted
Num C
Rating
Symbol Min
Typ
Max
Unit
Flash Reliability Characteristics
Data retention after 10,000 program/erase cycles at
1 C _{an average junction temperature of TJavg ≤ 85°C}
15
t_FLRET
Data retention with <100 program/erase cycles at an
2 C _{average junction temperature TJavg ≤ 85°C}
20
100²
100²
—
Years
—
Number of program/erase cycles
3 C _{(–40°C ≤ TJ ≤ 0°C)}
Number of program/erase cycles
4 C _{(0°C ≤ TJ ≤ 140°C)}
10,000
—
—
n_FL
Cycles
10,000
100,000³
—
EEPROM Reliability Characteristics
Data retention after up to 100,000 program/erase
5 C ^{cycles at an average junction temperature of}
T_Javg ≤ 85°C
15
t_EEPRET
Data retention with <100 program/erase cycles at an
6 C _{average junction temperature TJavg ≤ 85°C}
20
100²
100²
—
Years
—
Number of program/erase cycles
7 C _{(–40°C ≤ TJ ≤ 0°C)}
Number of program/erase cycles
8 C _{(0°C < TJ ≤ 140°C)}
n_EEP
10,000
—
100,000 _300,000³
—
Cycles
—
NOTES:
1. T_Javg will not exeed 85°C considering a typical temperature profile over the lifetime of a consumer, industrial or automotive
application.
2. Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
to 25°C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please
refer to Engineering Bulletin EB618.
3. Spec table quotes typical endurance evaluated at 25°C for this product family, typical endurance at various temperature can
be estimated using the graph below. For additional information on how Freescale defines Typical Endurance, please refer
to Engineering Bulletin EB619.
101