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EN27LN4G08 Datasheet, PDF (9/54 Pages) Eon Silicon Solution Inc. – 4 Gigabit (512M x 8), 3.3 V NAND Flash Memory
EN27LN4G08
VALID BLOCK
Symbol
Min.
Typ.
Max.
Unit
NVB
4,016
-
4,096
Blocks
Note:
1. The device may include initial invalid blocks when first shipped. The number of valid blocks is
presented as first shipped. Invalid blocks are defined as blocks that contain one or more bad bits
which cause status failure during program and erase operation. Do not erase or program factory-
marked bad blocks. Refer to the attached technical notes for appropriate management of initial
invalid blocks.
2. The 1st block, which is placed on 00h block address, is guaranteed to be a valid block at the time of
shipment and is guaranteed to be a valid block up to 1K program/erase cycles with 4 bit/512 bytes
ECC.
AC TEST CONDITION
(TA = 0 to 70°C or – 40°C to 85°C, VCC=2.7V~3.6V, unless otherwise noted)
Parameter
Condition
Input Pulse Levels
Input Rise and Fall Times
0V to VCC
5 ns
Input and Output Timing Levels
VCC /2
Output Load
1 TTL Gate and CL=50pF
Note:
Refer to Read/ Busy# section, R/B# output’s Busy to Ready time is decided by the pull-up resistor (Rp)
tied to the R/B# pin.
CAPACITANCE
(TA = 25°C, VCC=3.3V, f =1.0MHz)
Item
Symbol
Test Condition
Input / Output Capacitance
CI/O
VIL = 0V
Input Capacitance
CIN
VIN = 0V
Note: Capacitance is periodically sampled and not 100% tested.
Min.
-
-
Max.
Unit
8
pF
8
pF
MODE SELECTION
CLE
ALE
CE#
H
L
L
L
H
L
WE#
RE#
WP#
Mode
H
X
Command Input
Read Mode
H
X
Address Input (5 clock)
H
L
L
L
H
L
H
H
Command Input
Write Mode
H
H
Address Input (5 clock)
L
L
L
H
H
Data Input
L
L
L
H
X
Data Output
X
X
X
X
H
X
During Read (Busy)
X
X
X
X
X
H
During Program (Busy)
X
X
X
X
X
X (1)
X
X
X
X
H
X
X
H
During Erase (Busy)
X
L
Write Protect
X
0V/VCC(2) Stand-by
Note:
1. X can be VIL or VIH.
2. WP# should be biased to CMOS high or CMOS low for standby.
This Data Sheet may be revised by subsequent versions
9
or modifications due to changes in technical specifications.
©2013 Eon Silicon Solution, Inc., www.eonssi.com
Rev. A, Issue Date: 2013/10/03