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BQ33100_15 Datasheet, PDF (8/67 Pages) Texas Instruments – Super Capacitor Manager
bq33100
SLUS987B – JANUARY 2011 – REVISED DECEMBER 2015
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7.16 Low-Frequency Oscillator
Typical values stated where TA = 25°C and VCC = VCC = 14.4 V, Minimum and maximum values stated where TA = –40°C to
85°C and VCC = VCC = 3.8 V to 25 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP MAX UNIT
f(LOSC)
f(LEIO)
t(LSXO)
Operating frequency
Frequency error(1)
Start-up time(2)
TA = –20°C to 70°C
TA = –40°C to 85°C
TA = –25°C to 85°C
–1.5%
–2.5%
32.768
±0.25%
±0.25%
1.5%
2.5%
100
MHz
ms
(1) The frequency drift is included and measured from the trimmed frequency at VCC = VCC = 14.4 V, TA = 25°C.
(2) The start-up time is defined as the time it takes for the oscillator output frequency to be ±3%.
7.17 RAM Backup
Typical values stated where TA = 25°C and VCC = VCC = 14.4 V, Minimum and maximum values stated where TA = –40°C to
85°C and VCC = VCC = 3.8 V to 25 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
I(RBI)
V(RBI)
RBI data-retention input current
RBI data-retention voltage(1)
VRBI > V(RBI)MIN, VREG27 < VREG27IT-,
TA = 70°C to 110°C
VRBI > V(RBI)MIN, VREG27 < VREG27IT-,
TA = –40°C to 70°C
20
1500
nA
500
1
V
(1) Specified by design. Not production tested.
7.18 Flash
Typical values stated where TA = 25°C and VCC = VCC = 14.4 V, Minimum and maximum values stated where TA = –40°C to
85°C and VCC = VCC = 3.8 V to 25 V (unless otherwise noted)
PARAMETER (1)
TEST CONDITIONS
MIN
TYP
MAX UNIT
Data retention
10
Years
Flash programming write-cycles
20k
Cycles
t(ROWPROG)
t(MASSERASE)
t(PAGEERASE)
ICC(PROG)
ICC(ERASE)
Row programming time
Mass-erase time
Page-erase time
Flash-write supply current
Flash-erase supply current
TA = –40°C to 0°C
TA = 0°C to 85°C
2 ms
250 ms
25 ms
4
6 mA
8
22
mA
3
15
(1) Specified by design. Not production tested
8
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