BQ33100_15 Datasheet, PDF (4/67 Pages) Texas Instruments – Super Capacitor Manager

bq33100
SLUS987B – JANUARY 2011 – REVISED DECEMBER 2015
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PIN
NAME
NO.
VC3
5
VC4
6
VC5
10
VC5BAL
13
VCCPACK 1
VCC
24
Pin Functions (continued)
TYPE ⁽¹⁾
DESCRIPTION
IA
Sense voltage input terminal and external capacitor voltage balancing drive output for the 3rd series
capacitor. See Series Capacitor Configurationfor systems with less than 5 series
IA
Sense voltage input terminal and external capacitor voltage balancing drive output for the 2nd series
capacitor. See Series Capacitor Configuration for systems with less than 5 series
IA
Sense voltage input terminal and external capacitor voltage balancing drive output for the 1st capacitor. See
Series Capacitor Configuration for systems with less than 5 series
O Cell balance control output for the least positive capacitor (only used in 5-series capacitor configuration)
P Power supply from the supercaps. The top of the supercap stack must be connected to this pin.
P Positive input from power supply
7 Specifications
7.1 Absolute Maximum Ratings
Over operating free-air temperature range (unless otherwise noted)⁽¹⁾
MIN
MAX
UNIT
V_MAX
Supply voltage
VCC w.r.t. GND
VC1, VCC
–0.3
34
V
V_VC2 – 0.3 V_VC2 + 8.5 or
34, whichever V
is lower
V_IN
Input voltage
VC2
VC3
VC4
SRP, SRN
SDA, SCL
V_VC3 – 0.3 V_VC3 + 8.5
V
V_VC4 – 0.3 V_VC4 + 8.5
V
V_SRP – 0.3 V_SRP + 8.5
V
–0.3
V_REG27
V
–0.3
6.0
V
CHGOR
–0.3
VCC
V
TS, VC5, CHGLVL0, CHGLVL1, FAULT
CHG
–0.3
–0.3
V_REG27 + 0.3
V
VCC
V
V_O
Output voltage
VC5BAL
RBI, REG27
–0.3
–0.3
V_REG27 + 0.3
V
2.75
V
I_SS
T_FUNC
T_stg
Maximum combined sink current for input pins
Functional temperature
Storage temperature
50
mA
–40
110
°C
–65
150
°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
7.2 ESD Ratings
V_(ESD)
Electrostatic discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001⁽¹⁾
Charged-device model (CDM), per JEDEC specification JESD22-C101⁽²⁾
VALUE
±2000
±500
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
UNIT
V
4
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