THS789 Datasheet, PDF (7/34 Pages) Texas Instruments – THS789 Quad-Channel Time Measurement Unit (TMU)

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THS789
SLOS776A – SEPTEMBER 2012 – REVISED DECEMBER 2015
6.6 Host Serial Interface DC Characteristics
over operating junction temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
V_IH High-level input voltage
V_IL Low-level input voltage
V_OH High-level output voltage
V_OL Low-level output voltage
I_lkg Leakage current
MIN
0.7 × V_CC
GND – 0.3
V_CC – 0.5
0
TYP
MAX
V_CC + 0.5
0.3 × V_CC
V_CC + 0.3
0.4
1
UNIT
V
V
V
V
µA
6.7 Host Serial Interface AC Characteristics
over operating junction temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
HCLK frequency
Rise and fall times
HCLK duty cycle
Hstrobe high period between two consecutive transactions
Hstrobe low to HCLK high setup
HCLK high to Hstrobe high hold time
Hdata in to HCLK high setup
Hdata in to HCLK high hold time
HCLK falling edge to Hdata out (L or H)
HCLK falling edge to Hdata out (H or L)
C_L = 20 pF
C_L = 20 pF
MIN
40%
40
5
5
5
5
3.25
3.25
TYP
50%
MAX
50
3.5
60%
UNIT
MHz
ns
ns
ns
ns
ns
ns
ns
ns
6.8 Power Consumption
Typical conditions are at 55°C junction temperature, V_CC = 3.3 V.
CONDITION
Four channel current
TYP
MAX UNIT
925
1236 mA
6.9 Typical Characteristics
9
8
7
6
5
4
3
0
1
2
3
4
5
6
Sync to Event Delay (ns)
Figure 1. Typical Per Channel Sigmas vs 5-ns (200-MHz) Window
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