THS789 Datasheet, PDF (6/34 Pages) Texas Instruments – THS789 Quad-Channel Time Measurement Unit (TMU)

THS789
SLOS776A – SEPTEMBER 2012 – REVISED DECEMBER 2015
6.5 Electrical Characteristics
Typical conditions are at T_J = 55°C and V_CC = 3.3 V.
PARAMETER
TEST CONDITIONS
TDC CHARACTERISTICS
Time-measurement precision (LSB)
Measurement accuracy after calibration, mean
Single-event accuracy, one sigma
Time-measurement temperature coefficient
Time-measurement voltage coefficient
Event input rate
Minimum event pulse duration
Turnon time (ready to take timestamp)
MASTER CLOCK CHARACTERISTICS
Frequency
Duty cycle
Jitter
HIGH-SPEED LVDS INPUTS: MCLK, EVENT, SYNC
Differential input voltage
100-Ω termination, line-to-line
Common-mode voltage
Peak voltage, either input
Input capacitance
HIGH-SPEED LVDS OUTPUTS: Rdata, Rstrobe, RCLK
Differential output voltage
100-Ω termination, line-to-line
Common-mode voltage
Rise time/fall time
20%/80%
Output resistance
TEMPERATURE SENSOR DC CHARACTERISTICS
Output voltage
Output voltage temperature slope
T_J = 65°C
Max capacitive load
Max resistive load
OVERTEMPERATURE ALARM DC CHARACTERISTICS
Trip point
Active-low pulldown
Leakage current
Temperature < trip point
Output voltage, low
OUTPUT INTERFACE TIMING
I_sink = 1 ma
RCLK duty cycle
Rdata/Rstrobe to RCLK setup time
300 MHz
Rdata/Rstrobe to RCLK hold time
300 MHz
OPERATING PARAMETERS
Coarse counter range
Coarse counter max time range
Result-interface clock
Result-interface transfer format
Result-interface time range
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MIN TYP MAX UNIT
–800
13.02
800
0.1
±30
250
ps
800
ps
ps
ps/°C
ps/V
200 MHz
ps
250
μs
200
0.4
MHz
0.6
3 ps RMS
200
350
1.25
0.6
1
500 mV
V
1.7
V
pF
250
325
400 mV
1.125 1.28 1.375
V
250
ps
40
Ω
1.69
5
30
V
mV/°C
pF
10
kΩ
141
°C
1
μA
0.2
V
45% 50% 55%
1.4
ns
1.5
ns
34
–7.158
14.31
300
40
7.158
bit
s
MHz
bit
s
6
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