MSP430F23X_14 Datasheet, PDF (51/93 Pages) Texas Instruments – MIXED SIGNAL MICROCONTROLLER

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Crystal Oscillator XT2⁽¹⁾
PARAMETER
f_XT2
XT2 oscillator crystal frequency,
mode 0
f_XT2
XT2 oscillator crystal frequency,
mode 1
f_XT2
XT2 oscillator crystal frequency,
mode 2
TEST CONDITIONS
XT2Sx = 0
XT2Sx = 1
XT2Sx = 2
f_XT2
OA
C_L,eff
f_Fault
XT2 oscillator logic-level square-wave
input frequency
XT2Sx = 3
Oscillation allowance (see Figure 25
and Figure 26)
Integrated effective load capacitance,
HF mode⁽²⁾
XT2Sx = 0, f_XT2 = 1 MHz,
C_L,eff = 15 pF
XT2Sx = 1, f_XT2 = 4 MHz,
C_L,eff = 15 pF
XT2Sx = 2, f_XT2 = 16 MHz,
C_L,eff = 15 pF
See ⁽³⁾
Duty cycle
Oscillator fault frequency, HF mode⁽⁴⁾
Measured at P1.4/SMCLK,
f_XT2 = 10 MHz
Measured at P1.4/SMCLK,
f_XT2 = 16 MHz
XT2Sx = 3⁽⁵⁾
MSP430F23x
MSP430F24x(1)
MSP430F2410
SLAS547I – JUNE 2007 – REVISED DECEMBER 2012
V_CC
1.8 V to 3.6 V
1.8 V to 3.6 V
1.8 V to 2.2 V
2.2 V to 3.0 V
3.0 V to 3.6 V
1.8 V to 2.2 V
2.2 V to 3.0 V
3.0 V to 3.6 V
2.2 V, 3 V
2.2 V, 3 V
MIN TYP MAX UNIT
0.4
1 MHz
1
2
2
2
0.4
0.4
0.4
2700
4 MHz
10
12 MHz
16
10
12 MHz
16
800
Ω
300
1
pF
40
50
60
%
40
50
60
30
300 kHz
(1) To improve EMI on the XT2 oscillator the following guidelines should be observed:
(a) Keep the trace between the device and the crystal as short as possible.
(b) Design a good ground plane around the oscillator pins.
(c) Prevent crosstalk from other clock or data lines into oscillator pins XT2IN and XT2OUT.
(d) Avoid running PCB traces underneath or adjacent to the XT2IN and XT2OUT pins.
(e) Use assembly materials and praxis to avoid any parasitic load on the oscillator XT2IN and XT2OUT pins.
(f) If conformal coating is used, ensure that it does not induce capacitive or resistive leakage between the oscillator pins.
(2) Includes parasitic bond and package capacitance (approximately 2 pF per pin). Because the PCB adds additional capacitance, it is
recommended to verify the correct load by measuring the ACLK frequency. For a correct setup, the effective load capacitance should
always match the specification of the used crystal.
(3) Requires external capacitors at both terminals. Values are specified by crystal manufacturers.
(4) Frequencies below the MIN specification set the fault flag, frequencies above the MAX specification do not set the fault flag, and
frequencies in between might set the flag.
(5) Measured with logic-level input frequency, but also applies to operation with crystals.
Copyright © 2007–2012, Texas Instruments Incorporated
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