THS788 Datasheet, PDF (5/43 Pages) Texas Instruments – QUAD-CHANNEL TIME MEASUREMENT UNIT (TMU)

THS788
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HOST SERIAL INTERFACE DC CHARACTERISTICS
over operating junction temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
V_IH High-level input voltage
V_IL Low-level input voltage
V_OH High-level output voltage
V_OL Low-level output voltage
I_lkg Leakage current
SLOS616B – MARCH 2010 – REVISED JUNE 2011
MIN TYP
0.7 × VCC
GND – 0.3
VCC – 0.5
0
MAX
VCC + 0.5
0.3 × VCC
VCC + 0.3
0.4
1
UNIT
V
V
V
V
µA
HOST SERIAL INTERFACE AC CHARACTERISTICS
over operating junction temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
HCLK frequency
Rise and fall times
HCLK duty cycle
Hstrobe high period between two consecutive transactions
Hstrobe low to HCLK high setup
HCLK high to Hstrobe high hold time
Hdata in to HCLK high setup
Hdata in to HCLK high hold time
HCLK falling edge to Hdata out (L or H)
HCLK falling edge to Hdata out (H or L)
C_L = 20 pF
C_L = 20 pF
MIN
40%
40
5
5
5
5
3.25
3.25
TYP
50%
MAX
50
3.5
60%
UNIT
MHz
ns
ns
ns
ns
ns
ns
ns
ns
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