TLC320AD55 Datasheet, PDF (30/41 Pages) Texas Instruments – Sigma-Delta Analog Interface Circuit

4.4.6 DAC Dynamic Performance
4.4.6.1 DAC Signal-to-Noise (see Note 4)
PARAMETER
TEST CONDITIONS MIN TYP MAX UNIT
VO = 0 dB
74
80
Signal-to-noise ratio (SNR)
VO = – 9 dB
70
74
dB
VO = – 40 dB
38
44
VO = – 65 dB
14
18
NOTE 4: The test condition is the digital equivalent of a 1020 Hz input signal with an 8 kHz conversion rate. The load
impedance is 600 Ω . Input and output voltages are referred to VDD /2.
4.4.6.2 DAC Signal-to- Distortion (see Note 4)
PARAMETER
TEST CONDITIONS MIN TYP MAX UNIT
VO = 0 dB
74
84
Signal-to-total harmonic distortion (THD)
VO = – 9 dB
74
84
dB
VO = – 40 dB
40
58
VO = – 65 dB
18
30
NOTE 4: The test condition is the digital equivalent of a 1020 Hz input signal with an 8 kHz conversion rate. The load
impedance is 600 Ω . Input and output voltages are referred to VDD /2.
4.4.6.3 DAC Signal-to-Distortion + Noise (see Note 4)
PARAMETER
TEST CONDITIONS MIN TYP MAX UNIT
VO = 0 dB
72
78
Total harmonic distortion+noise (THD+N)
VO = – 9 dB
68
74
dB
VO = – 40 dB
38
44
VO = – 65 dB
14
20
NOTE 4: The test condition is the digital equivalent of a 1020 Hz input signal with an 8 kHz conversion rate. The load
impedance is 600 Ω . Input and output voltages are referred to VDD /2.
4.4.7 DAC Channel
PARAMETER
TEST CONDITIONS
MIN TYP MAX UNIT
Dynamic range
80
dB
Interchannel isolation
80
dB
Gain error, 0 dB
Gain error, dc
VO = 0 dB at 1020 Hz
Digital input offset = 1 V dc
± 0.5 dB
± 0.2
dB
Idle channel broad-band noise See Note 7
100 µV rms
Idle channel narrow-band noise 0 – 4 kHz, See Note 7
40 µV rms
VOO
Output offset voltage at OUT
(differential)
DIN = All 0s
8
mV
Analog output voltage,
RL = 600,
VO peak-to-peak, OUTP – OUTM With internal reference and full-scale
(differential)
digital input, (see Note 8)
6V
NOTES: 7. The conversion rate is 8 kHz; the out-of-band measurement is made from 4800 Hz to FMCLK/2.
8. The digital input to the DAC channel at DIN is in 2s complement.
4–4