ADS1218_14 Datasheet, PDF (2/45 Pages) Texas Instruments – 8-Channel, 24-Bit ANALOG-TO-DIGITAL CONVERTER with FLASH Memory

ADS1218
SBAS187C – SEPTEMBER 2001 – REVISED SEPTEMBER 2005
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated
circuits be handled with appropriate precautions. Failure to observe proper handling and installation
procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision
integrated circuits may be more susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
ORDERING INFORMATION
For the most current package and ordering information, see the Package Option Addendum at the end of this
document, or see the TI web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
AV_DD to AGND
DV_DD to DGND
Input Current
Input Current
A_IN
AV_DD to DV_DD
AGND to DGND
Digital Input Voltage to GND
Digital Output Voltage to GND
Maximum Junction Temperature
Operating Temperature Range
Storage Temperature Range
Lead Temperature (soldering, 10s)
–0.3V to +6V
–0.3V to +6V
100mA, Momentary
10mA, Continuous
GND – 0.5V to AVDD + 0.5V
–6V to +6V
–0.3V to +0.3V
–0.3V to DV_DD + 0.3V
–0.3V to DV_DD + 0.3V
+150°C
–40°C to +85°C
–60°C to +100°C
+300°C
(1) Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2