DAC8734_091 Datasheet, PDF (2/41 Pages) Texas Instruments – Quad, 16-Bit, High-Accuracy, ±16V Output, Serial Input DIGITAL-TO-ANALOG CONVERTER

DAC8734
SBAS465A – MAY 2009 – REVISED SEPTEMBER 2009 .................................................................................................................................................. www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION⁽¹⁾
PRODUCT
DAC8734
RELATIVE
ACCURACY
(LSB)
±1
±1
DIFFERENTIAL
LINEARITY
(LSB)
±1
±1
PACKAGE-
LEAD
QFN-40
TQFP-48
PACKAGE
DESIGNATOR
RHA
PFB
SPECIFIED
TEMPERATURE
RANGE
–40°C to +105°C
–40°C to +105°C
PACKAGE
MARKING
DAC8734
DAC8734
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this data sheet, or see the TI
website at www.ti.com.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
Over operating free-air temperature range (unless otherwise noted).
AV_DD to AV_SS ⁽²⁾
AV_DD to AGND⁽²⁾
AV_SS to AGND, DGND⁽²⁾
DV_DD to DGND
IOV_DD to DGND
Digital input voltage to DGND
SDO to DGND
SGND-x, REFGND-x, AGND to DGND
V_OUT-x, R_FB1-x, R_FB2-x, V_MON, AIN to AV_SS
REF-x to REFGND-x, AGND
GPIO-x to DGND
GPIO-x input current
Operating temperature range
Storage temperature range
Maximum junction temperature (T_J max)
ESD ratings
Human body model (HBM)
Charged device model (CDM)
Thermal impedance
Power dissipation⁽³⁾
Junction-to-ambient, θ_JA
Junction-to-case, θ_JC
TQFP
QFN
TQFP
QFN
DAC8734
–0.3 to 38
–0.3 to 25
–19 to 0.3
–0.3 to 6
–0.3 to DV_DD + 0.3
–0.3 to IOV_DD + 0.3
–0.3 to IOV_DD + 0.3
–0.3 to +0.3
–0.3 to AV_DD + 0.3
–0.3 to min(AV_DD/2, –AV_SS/2)
–0.3 to 6
5
–40 to +105
–65 to +150
+150
4
1
57
32
35
20
(T_J max – T_A) / θ_JA
UNIT
V
V
V
V
V
V
V
V
V
V
V
mA
°C
°C
°C
kV
kV
°C/W
°C/W
°C/W
°C/W
W
(1) Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
(2) AV_SS must be < –3.5V if AV_DD ≥ 1V.
(3) T_A is the ambient temperature.
2
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