CD00001237 Datasheet, PDF (80/105 Pages) STMicroelectronics – 8-bit MCUs with A/D converter

ST6215C ST6225C
EMC CHARACTERISTICS (Cont’d)
11.7.2.2 Static and Dynamic Latch-Up
■ LU: 3 complementary static tests are required
on 10 parts to assess the latch-up performance.
A supply overvoltage (applied to each power
supply pin), a current injection (applied to each
input, output and configurable I/O pin) and a
power supply switch sequence are performed
on each sample. This test conforms to the EIA/
JESD 78 IC latch-up standard. For more details,
refer to the AN1181 application note.
■ DLU: Electro-Static Discharges (one positive
then one negative test) are applied to each pin
of 3 samples when the micro is running to
assess the latch-up performance in dynamic
mode. Power supplies are set to the typical
values, the oscillator is connected as near as
possible to the pins of the micro and the
component is put in reset mode. This test
conforms to the IEC1000-4-2 and SAEJ1752/3
standards and is described in Figure 58. For
more details, refer to the AN1181 application
note.
Electrical Sensitivities
Symbol
LU
DLU
Parameter
Static latch-up class
Dynamic latch-up class
Conditions
T_A=+25°C
T_A=+85°C
V_DD=5V, f_OSC=4MHz, T_A=+25°C
Class ¹⁾
A
A
A
Notes:
1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC spec-
ifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the
JEDEC criteria (international standard).
2. Schaffner NSG435 with a pointed test finger.
Figure 58. Simplified Diagram of the ESD Generator for DLU
R_CH=50MΩ
C_S=150pF
ESD
GENERATOR ²⁾
R_D=330Ω
DISCHARGE TIP
V_DD
HV RELAY
V_SS
ST6
DISCHARGE
RETURN CONNECTION
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