PALCE16V8 Datasheet, PDF (21/32 Pages) Advanced Micro Devices – EE CMOS 20-Pin Universal Programmable Array Logic

ABSOLUTE MAXIMUM RATINGS
OPERATING RANGES
Storage Temperature . . . . . . . . . . . . . .-65°C to +150°C _{Industrial (I) Devices}
Ambient Temperature
with Power Applied . . . . . . . . . . . . . .-55°C to +125°C
Supply Voltage
with Respect to Ground . . . . . . . . . . -0.5 V to + 7.0 V
DC Input Voltage . . . . . . . . . . . -0.5 V to V_CC + 0.5 V
DC Output or I/O Pin Voltage . . . -0.5 V to V_CC + 0.5 V
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Ambient Temperature (T_A)
Operating in Free Air . . . . . . . . . . . . . . -40°C to +85°C
Supply Voltage (V_CC)
with Respect to Ground . . . . . . . . . . . +4.5 V to +5.5 V
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
Latchup Current (T_A = -40°C to +85°C). . . . . . . 100 mA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum Rat-
ings for extended periods may affect device reliability. Pro-
gramming conditions may differ.
FOR
S _{DC CHARACTERISTICS OVER INDUSTRIAL OPERATING RANGES}
E _{S Parameter}
IC ^Symbol
Parameter Description
V ^{N V}OH
Output HIGH Voltage
DE ^SIG V_OL
Output LOW Voltage
L _{DE VIH}
Input HIGH Voltage
GA ^W _VIL
Input LOW Voltage
E ^{E I}IH
Input HIGH Leakage Current
S ^{N IIL}
Input LOW Leakage Current
U ^IOZH
Off-State Output Leakage Current HIGH
Test Description
V_IN = V_IH or V_IL, V_CC = Min
V_IN = V_IH or V_IL, V_CC = Min
Guaranteed Input Logical HIGH
Voltage for all Inputs (Notes 1 and 2)
I_OH = 6 mA
I_OH = 20 µA
I_OL = 24 mA
I_OL = 6 mA
I_OL = 20 µA
Guaranteed Input Logical LOW
Voltage for all Inputs (Notes 1 and 2)
V_IN = 5.25 V, V_CC = Max (Note 3)
V_IN = 0 V, V_CC = Max (Note 3)
V_OUT = 5.25 V, V_CC = Max
V_IN = V_IH or V_IL (Note 3)
Min
3.84
V_CC – 0.1 V
2.0
Max
0.5
0.33
0.1
0.9
10
–10
10
Unit
V
V
V
V
V
V
V
µA
µA
µA
I_OZL
Off-State Output Leakage Current LOW
V_OUT = 0 V, V_CC = Max
V_IN = V_IH or V_IL (Note 3)
–10
µA
I_SC
Output Short-Circuit Current
V_OUT = 0.5 V, V_CC = Max (Note 4)
–30
–150 mA
Supply Current (Static)
I_CC
Supply Current (Dynamic)
Outputs Open (I_OUT = 0 mA)
V_CC = Max
f = 0 MHz
f = 25 MHz
15
µA
75
mA
Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. Represents the worst case of HC and HCT standards, allowing compatibility with either.
3. I/O pin leakage is the worst case of I_IL and I_OZL (or I_IH and I_OZH).
4. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second.
V_OUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
PALCE16V8Z-15 (Ind)
21