V-SERIES Datasheet, PDF (40/45 Pages) Keysight Technologies – Infiniium V-Series Oscilloscopes

40 | Keysight | Infiniium V-Series Oscilloscopes - Data Sheet
Infiniium V-Series Performance Characteristics (Continued)
Measurements and math (Continued)
Oscilloscope measurements
Eye-diagram measurements ¹
Jitter analysis measurements ²
Clock
Data
Jitter separation
RJ setting
Mask testing
Math functions
Waveform math
Number of functions
Number of gating functions
Math source
Hardware accelerated math
Operators
FFT
Frequency range
Frequency resolution
Window modes
Number of FFTs
Peak mode
Eye height, eye width, eye jitter, crossing percentage, Q factor, and duty-cycle distortion
Time interval error, N-period, period to period, + width to + width, - width to - width, and duty cycle-to-
duty cycle
Random jitter (RJ), deterministic jitter (DJ), aperiodic bounded uncorrelated jitter (ABUJ), periodic jitter
(PJ), data dependent jitter (DDJ), duty cycle distortion (DCD), intersymbol interference (ISI)
Spectral method (RJ narrow and wide), tailfit
Ability to fix random jitter (RJ) for crosstalk measurements
Allows pass/fail testing to user-defined or Keysight-supplied waveform templates. Automask lets
you create a mask template from a captured waveform and define a tolerance range in time/voltage
or screen divisions. Test modes (run until) include test forever, test to specified time or event limit,
and stop on failure. Executes “multipurpose” user setting on failure. “Unfold real-time eye” feature
will allow individual bit errors to be observed by unfolding a real-time eye when clock recovery is on.
Communications mask test kit option provides a set of ITU-T G.703, ANSI T1.102, and IEEE 802.3
industry-standard masks for compliance testing.
Up to 16 independent functions
Up to 16 horizontal measurement gates (any function can be used as a gate)
Any combination of channels, memories or other functions
Differential and common mode (analog)
Absolute value, add, AM demodulation, average, Butterworth ¹, common mode, delay, differentiate,
divide, envelope, FFT magnitude, FFT phase, FIR ¹, gating, high pass filter, histogram, integrate, invert,
LFE¹, low pass filter (4th-order Bessel Thompson filter), magnify, max, meas trend, min, multiply,
RT Eye ¹, smoothing, SqrtSumOfSquare ¹, square, square root, subtract, versus, chart (MSO models) and
user-defined function ^{3, 4}
DC to 40 GHz (at 80 GSa/s) or 20 GHz (at 40 GSa/s)
Resolution = sample rate/memory depth
Hanning, flattop, rectangular, Blackman-Harris, Hamming
Display up to 16 FFTs, each in their own grid with up to eight in their own waveform area
Choose peak callouts to display peak values on the screen
1.  Requires Serial Data Analysis (Option E2688A) software.
2.  Requires EZJIT Plus (Option N5400A) or EZJIT Complete (Option N8823A) software.
3.  Requires MATLAB (Option N8831A) software.
4.  Requires user-defined function (Option N5430A) software.