TC1728 Datasheet, PDF (75/130 Pages) Infineon Technologies AG – 32-Bit Single-Chip Microcontroller

TC1728
Electrical Parameters
Table 22 3.3V ADC Parameters
Parameter
Symbo
Values
Unit
l
Min. Typ. Max.
Note /
Test Condition
Resistance of the
reference voltage input
path
R_AREF −
CC
Broken wire detection
delay against VAGND
Broken wire detection
delay against VAREF
t_BWG
−
CC
t_BWR CC −
1700 3000
− 50
Ohm
13)
500 Ohm
increased if
AIN[1:0] used
as reference
input
− 50
14)
Sample time
t_S CC 2
−
257
T_ADCI
Calibration time after bit t_CAL CC −
ADC_GLOBCFG.SUCAL
is set
− 4352 cycles
Total Unadjusted
Error^5)6)15)
TUE -4.5
−
4.5¹⁶⁾ LSB ADC
CC
resolution= 12-
bit
Analog reference
ground²⁾
V_AGND0 V_SSM - −
SR 0.05
Analog input voltage
V_AIN SR V_AGND0 −
Analog reference
voltage²⁾
V_AREF0
SR
V_AGND0 −
+
V_DDM/2
Analog reference voltage V_AREF0 - V_DDM/2 −
range⁵⁾⁶⁾²⁾
V_AGND0
SR
V_AREF0 V
-
V_DDM/2
V_AREF0 V
V_DDM + V
0.05¹⁷⁾
18)
V_DDM + V
0.05
1) The sampling capacity of the conversion C-network is pre-charged to V_AREF/2 before the sampling moment.
Because of the parasitic elements the voltage measured at AINx can deviate from V_AREF/2.
2) Applies to AINx, when used as auxiliary reference input.
3) This represents an equivalent switched capacitance. This capacitance is not switched to the reference voltage
at once. Instead smaller capacitances are successively switched to the reference voltage.
4) The sum of DNL/INL/GAIN/OFF errors does not exceed the related TUE total unadjusted error.
5) If the analog reference voltage range is below V_DDM but still in the defined range of V_DDM / 2 and V_DDM is used,
then the ADC converter errors increase. If the reference voltage is reduced by the factor k (k<1),
TUE,DNL,INL,Gain, and Offset errors increase also by the factor 1/k.
Data Sheet
5-29
V1.2, 2014-06