HY29LV160 Datasheet, PDF (29/48 Pages) Hynix Semiconductor – 16 Mbit (2M x 8/1M x 16) Low Voltage Flash Memory

AC CHARACTERISTICS
HY29LV160
Hardware Reset (RESET#)
Parameter
JEDEC Std
Description
Test Setup
Speed Option
Unit
- 70 - 80 - 90 - 12
t_READY
RESET# Pin Low (During Automatic
Algorithms) to Read or Write ¹
Max
20
µs
t_READY
RESET# Pin Low (NOT During Automatic
Algorithms) to Read or Write ¹
Max
500
ns
t_RP RESET# Pulse Width
t_RH RESET# High Time Before Read ¹
t_RPD RESET# Low to Standby Mode
t_RB RY/BY# Recovery Time
Notes:
1. Not 100% tested.
2. See Figure 13 and Table 12 for test conditions.
Min
500
ns
Min
50
ns
Max
20
µs
Min
0
ns
RY/BY# _{0 V}
CE#, OE#
RESET#
t_RH
t_RP
t_Ready
Reset Timings NOT During Automatic Algorithms
RY/BY#
CE#, OE#
RESET#
t_Ready
t_RB
t_RP
Reset Timings During Automatic Algorithms
Figure 16. RESET# Timings
Rev. 1.2/May 01
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