English
Language : 

HMT351U6MFR8C-S6 Datasheet, PDF (29/47 Pages) Hynix Semiconductor – 240pin DDR3 SDRAM Unbuffered DIMMs
HMT351U6MFR8C
HMT351U7MFR8C
6.7 IDD Measurement Conditions
In this chapter, IDD and IDDQ measurement conditions such as test load and patterns are defined. Figure 1. shows the
setup and test load for IDD and IDDQ measurements.
• IDD currents (such as IDD0, IDD1, IDD2N, IDD2NT, IDD2P0, IDD2P1, IDD2Q, IDD3N, IDD3P, IDD4R, IDD4W,
IDD5B, IDD6, IDD6ET, IDD6TC and IDD7) are measured as time-averaged currents with all VDD balls of the
DDR3 SDRAM under test tied together. Any IDDQ current is not included in IDD currents.
• IDDQ currents (such as IDDQ2NT and IDDQ4R) are measured as time-averaged currents with all VDDQ balls of
the DDR3 SDRAM under test tied together. Any IDD current is not included in IDDQ currents.
Attention: IDDQ values cannot be directly used to calculate IO power of the DDR3 SDRAM. They can be used to
support correlation of simulated IO power to actual IO power as outlined in Figure 2. In DRAM module application,
IDDQ cannot be measured separately since VDD and VDDQ are using one merged-power layer in Module PCB.
For IDD and IDDQ measurements, the following definitions apply:
• ”0” and “LOW” is defined as VIN <= VILAC(max).
• ”1” and “HIGH” is defined as VIN >= VIHAC(max).
• “FLOATING” is defined as inputs are VREF - VDD/2.
• Timing used for IDD and IDDQ Measurement-Loop Patterns are provided in Table 1 on Page 26.
• Basic IDD and IDDQ Measurement Conditions are described in Table 2 on page 26.
• Detailed IDD and IDDQ Measurement-Loop Patterns are described in Table 3 on page 30 through Table 10 on
page 36.
• IDD Measurements are done after properly initializing the DDR3 SDRAM. This includes but is not limited to setting
RON = RZQ/7 (34 Ohm in MR1);
Qoff = 0B (Output Buffer enabled in MR1);
RTT_Nom = RZQ/6 (40 Ohm in MR1);
RTT_Wr = RZQ/2 (120 Ohm in MR2);
TDQS Feature disabled in MR1
• Attention: The IDD and IDDQ Measurement-Loop Patterns need to be executed at least one time before actual
IDD or IDDQ measurement is started.
• Define D = {CS, RAS, CAS, WE}:= {HIGH, LOW, LOW, LOW}
• Define D = {CS, RAS, CAS, WE}:= {HIGH, HIGH, HIGH, HIGH}
Rev. 0.3 / Jan 2009
29