MC33662LEF Datasheet, PDF (7/31 Pages) Freescale Semiconductor, Inc – LIN 2.1 / SAEJ2602-2, LIN Physical Layer

ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 4. Limits / Maximum Test Voltage for Transient Immunity Tests
Test Pulse
1
2a
3a
3b
V_S [V]
-100
+75
-150
+100
Pulse repetition
frequency [Hz]
(1/T₁)
2
2
10000
10000
Test Duration [min]
1 for function test
10 for damage test
R_i []
10
2
50
50
DUT
VSUP
DUT GND
D1
10 µF
Transient Pulse
Generator
(Note)
GND
Remarks
t₂ = 0 s
Note Waveform per ISO 7637-2. Test Pulses 1, 2a, 3a, 3b.
Figure 4. Test Circuit for Transient Test Pulses (VSUP)
DUT
WAKE
18 k
DUT GND
1.0 nF
18 k
Transient Pulse
Generator
(Note)
GND
Note Waveform per ISO 7637-2. Test Pulses 1, 2a, 3a, 3b.
Figure 5. Test Circuit for Transient Test Pulses (WAKE)
DUT
LIN
DUT GND
1.0 nF
Transient Pulse
Generator
(Note)
GND
Note Waveform per ISO 7637-2. Test Pulses 1, 2a, 3a, 3b.
Figure 6. Test Circuit for Transient Test Pulses (LIN)
DUT
INH
DUT GND
1.0 nF
Transient Pulse
Generator
(Note)
GND
Note Waveform per ISO 7637-2. Test Pulses 1, 2a, 3a, 3b.
Figure 7. Test Circuit for Transient Test Pulses (INH)
Analog Integrated Circuit Device Data
Freescale Semiconductor
33662
7