MC33662LEF Datasheet, PDF (14/31 Pages) Freescale Semiconductor, Inc – LIN 2.1 / SAEJ2602-2, LIN Physical Layer

ELECTRICAL CHARACTERISTICS
TIMING DIAGRAMS
TXD
TBIT
TBIT
V_{LIN_REC}
TH_REC(MAX)^{74.4% V}SUP
TH_DOM(MAX) ^{58.1% V}SUP
LIN
TH_REC(MIN) ^{42.2% VSUP}
TH_DOM(MIN) ^{28.4% V}SUP
t_{BUS_DOM}(MAX)
t_{BUS_REC}(MIN)
Thresholds of
receiving node 1
Thresholds of
receiving node 2
RXD
Output of receiving Node 1
t_{REC_PDF(1)}
RXD
Output of receiving Node 2
t_{BUS_DOM}(MIN)
t_{REC_PDR(2)}
t_{BUS_REC}(MAX)
t_{REC_PDR(1)}
t_{REC_PDF(2)}
Figure 9. LIN Timing Measurements for Normal Baud Rate (33662L and 33662S)
TXD
TBIT
TBIT
V_{LIN_REC}
TH_REC(MAX)^{77.8% V}SUP
TH_DOM(MAX) ^{61.6% V}SUP
LIN
TH_REC(MIN) ^{38.9% VSUP}
TH_DOM(MIN) ^{25.1% V}SUP
t_{BUS_DOM}(MAX)
t_{BUS_REC}(MIN)
RXD
Output of receiving Node 1
t_{REC_PDF(1)}
RXD
Output of receiving Node 2
t_{BUS_DOM}(MIN)
t_{REC_PDR(2)}
t_{BUS_REC}(MAX)
t_{REC_PDR(1)}
t_{REC_PDF(2)}
Figure 10. LIN Timing Measurements for Slow Baud Rate (33662J)
Thresholds of
receiving node 1
Thresholds of
receiving node 2
33662
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Analog Integrated Circuit Device Data
Freescale Semiconductor