ISD-200 Datasheet, PDF (47/64 Pages) List of Unclassifed Manufacturers – USB Mass Storage Class Bulk-Only Specification Compliant

ISD-200 ASIC Datasheet
PDIAG and PDASP Hookup
Power on diagnostics timeout (750 ms and 30 s) must be limited to avoid an ISD-200 timeout. One method
to accomplish this is to make sure PDIAG and PDASP are grounded on the circuit board and the device is
wired to be master.
Absolute Maximum Ratings
Stresses in excess of the absolute maximum ratings can cause permanent damage to the device. These are
absolute stress ratings only. Functional operation of the device is not implied at these or any other
conditions in excess of those given in the operations sections of this data sheet. Exposure to absolute
maximum ratings for extended periods can adversely affect device reliability.
Symbol
VDD33
VDD18
Vin
Iin
Ta
Tstrg
Parameter
Min
3.3 V IO Supply
-0.5
1.8 V IO Supply
-0.5
5V Tolerant Input Pin Voltage
-0.5
3.3V Input Pin Voltage
-0.5
Input Pin Current
-20
Ambient Operating Temperature Range ^0°
Storage Temperature
-65
Table 15 – Absolute Maximum Ratings
Max
4.0
2.0
5.5
V_DD33 + 0.5
20
70°
150
Units
Volts
Volts
Volts
mA
Celsius
Celsius
Electrical Characteristics
Voltage Parameter ^{Symbol Test Conditions Min Typ Max Unit}
Input Voltage Low
V_IL
Input Voltage High
V_IH


 ^0.8
V

2.0 _

V
Output Voltage Low
V_OL

Output Voltage High
V_OH

Power Supply Voltage
V_DD33

V_DD18

Note: (T_A = 0 °C, V_DD33 = 3.3 V ± 0.3 V, V_SS = 0 V)

 ^0.4
V
2.4 _

V
3.0 3.3 3.6
V
1.65 ^{1.8 1.95} V
Table 16 – DC Characteristics
In-System Design Confidential
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