NS9210B-0-I75 Datasheet, PDF (20/68 Pages) List of Unclassifed Manufacturers – Figure 1 shows the NS7520 modules. Dashed lines indicate shared pins

System mode (test support)
System mode (test support)
PLLTST_, BISTEN_, and SCANEN_ primary inputs control different test modes for both functional
and manufacturing test operations (see Table 3: "NS7520 test modes" on page 22).
Symbol
PLLTST_
BISTEN_
SCANEN_
Pin
N15
M15
L13
I/O OD Description
I
Encoded with BISTEN_ and SCANEN_
Add an external pullup to 3.3V or pulldown to GND.
I
Encoded with PLLTST_ and SCANEN_
Add an external pullup to 3.3V or pulldown to GND.
I
Encoded with BISTEN_ and PLLTST_
Add an external pullup to 3.3V or pulldown to GND.
JTAG test
JTAG boundary scan allows a tester to check the soldering of all signal pins and tri-state all
outputs.
Symbol
TDI
TDO
TMS
TRST_
TCK
Pin
I/O OD Description
N14 U I
Test data in.
M13
O
2
Test data out.
M12 U I
Test mode select.
M14
I
Test mode reset.
Requires external termination when not being used (see
Figure 3, "TRST_ termination," on page 17 for an
illustration of the termination circuit on the development
PCB).
P15
I
Test mode clock.
Add an external pullup to 3.3V.
ARM debugger signal descriptions
Mnemonic
TDI
Signal
Test data in
TDO
Test data out
TMS
Test mode select
Description
TDI operates the JTAG standard. Consult the JTAG specifications
for use in boundary-scan testing. These signals meet the
requirements of the Raven and Jeeni debuggers.
TDO operates the JTAG standard. Consult the JTAG specifications
for use in boundary-scan testing. These signals meet the
requirements of the Raven and Jeeni debuggers.
TMS operates the JTAG standard. Consult the JTAG specifications
for use in boundary-scan testing. These signals meet the
requirements of the Raven and Jeeni debuggers.
16
NS7520 Datasheet 03/2006