MA17502 Datasheet, PDF (29/30 Pages) Dynex Semiconductor – Radiation Hard MIL-STD-1750A Control Unit

MA17502
10.0 RADIATION TOLERANCE
Total Dose Radiation Testing
For product procured to guaranteed total dose radiation
levels, each wafer lot will be approved when all sample devices
from each lot pass the total dose radiation test.
The sample devices will be subjected to the total dose
radiation level (Cobalt-60 Source), defined by the ordering
code, and must continue to meet the electrical parameters
specified in the data sheet. Electrical tests, pre and post
irradiation, will be read and recorded.
Dynex Semiconductor can provide radiation testing
compliant with Mil-Std-883 method 1019 Ionizing Radiation
(total dose) test.
Total Dose (Function to specification)*
3x10⁵ Rad(Si)
Transient Upset (Stored data loss)
1x10¹¹ Rad(Si)/sec
Transient Upset (Survivability)
>1x10¹² Rad(Si)/sec
Neutron Hardness (Function to specification) >1x10¹⁵ n/cm²
Single Event Upset**
<1x10^-10 Errors/bit day
Latch Up
Not possible
* Other total dose radiation levels available on request
** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit
Table 10: Radiation Hardness Parameters
11.0 ORDERING INFORMATION
Unique Circuit Designator
Radiation Tolerance
S Radiation Hard Processing
R 100 kRads (Si) Guaranteed
Q 300 kRads (Si) Guaranteed
Package Type
C Ceramic DIL (Solder Seal)
F Flatpack (Solder Seal)
L Leadless Chip Carrier
MAx17502xxxxx
QA/QCI Process
(See Section 9 Part 4)
Test Process
(See Section 9 Part 3)
Assembly Process
(See Section 9 Part 2)
For details of reliability, QA/QC, test and assembly
options, see ‘Manufacturing Capability and Quality
Assurance Standards’ Section 9.
Reliability Level
L Rel 0
C Rel 1
D Rel 2
E Rel 3/4/5/STACK
B Class B
S Class S
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