PS-AT65609EHW Datasheet, PDF (8/30 Pages) ATMEL Corporation – MICROCIRCUIT, DIGITAL, MEMORY, 8K x 8-Bit, 5V Very Low Power CMOS SRAM, MONOLITHIC SILICON

PS-AT65609EHW
Rev A
4.2 Sampling and inspection.
Sampling and inspection procedures shall be in accordance with MIL-PRF-38535.
4.3 Screening.
Screening equivalent to MIL-PRF-38535. Screening shall be conducted on all devices prior to qualification
and technology conformance inspection
• The burn-in test duration, test condition and test temperature, or approved alternatives shall be as
specified in accordance with MIL-PRF-38535.
• Additional screening for space application devices shall be as specified in MIL-PRF-38535, appendix B.
4.4 Quality conformance inspection
Qualification inspection for high reliability and space level devices shall be in accordance with MIL-PRF-
38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A,
B, C, D, and E inspections.
4.4.1 Group A inspection.
• Tests shall be as specified in Electrical and timing characteristics section page 9.
• Subgroups 5 and 6 of table I of method 5005 of MIL STD 883 shall be omitted.
• Subgroups 7 and 8 of table I of method 5005 of MIL STD 883 shall include verifying the
functionality of the device.
• O/V (latch up) tests shall be measured only for the initial qualification and after any process or
design changes which may affect the performance of the device.
• Capacitance measurement shall be measured only for initial qualification and after any
process or design changes which may affect input or output capacitance. Capacitance shall
be measured between the designated terminal and GND at a frequency of 1 MHz. Sample
size is five devices with no failure, and all input and output terminals tested.
4.4.2 Group C inspection.
The group C inspection end-point electrical parameters shall be as specified in in Electrical and
timing characteristics section page 9.
4.4.3 Group D inspection.
The group D inspection end-point electrical parameters shall be as specified in Electrical and timing
characteristics section page 9.
4.5 Delta measurements
Delta measurements, as specified in Parameter drift values section page 18, shall be made and recorded
before and after the required burn-in screens to determine delta compliance. The electrical parameters to
be measured, with associated delta limits are listed in Parameter drift values section page 18. The device
manufacturer may, at his option, either perform delta measurements or within 24 hours after life test
perform final electrical parameter tests, subgroups 1, 7 and 9.
5 PACKAGING
5.1 Packaging requirements
The requirements for packaging shall be in accordance with MIL-PRF-38535.
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