PS-AT65609EHW Datasheet, PDF (7/30 Pages) ATMEL Corporation – MICROCIRCUIT, DIGITAL, MEMORY, 8K x 8-Bit, 5V Very Low Power CMOS SRAM, MONOLITHIC SILICON

PS-AT65609EHW
Rev A
3.2.3 Traceability Information
Each component shall be marked in respect of traceability information : lot number and date code.
3.3 Electrical characteristics
The parameters to be measured with respect of electrical characteristics are scheduled in Electrical and
timing characteristics section page 9. The measurements shall be performed at T_amb=22 ± 3°C, T_high=125
(+0/-5)°C and T_low = -55 (+5/-0)°C respectively.
3.4 Burn-in test
3.4.1 Electrical circuit
Circuit for use in performing the power burn-in is shown in Power burn-in and operating life test
section page 27, in accordance with the intent specified in test method 1015 of MIL-STD-883.
3.4.2 Parameters drift value
For space level, the parameter drift values applicable to burn-in are specified in Parameter drift
values section page 18. Unless otherwise stated, measurements shall be performed at +22 +/- 3°C.
The parameter drift values (Δ), applicable to the parameters scheduled, shall not be exceeded.
In addition to these drift value requirements, the appropriate limit value specified for a given
parameter in Electrical and timing characteristics section page 9 shall not be exceeded.
.
3.5 Environmental and Endurance Tests
3.5.1 Electrical Circuit for Operating Life Test
The circuit for operating life testing shall be as specified for power burn in Power burn-in and
operating life test section page 27.
3.5.2 Electrical Measurements at Completion of Environmental and endurance tests
The parameters to be measured are scheduled in Electrical and timing characteristics section page
9.
Unless otherwise stated, the measurements shall be performed at tamb = 22 +/-3°C.
3.5.3 Conditions for Operating Life Test
The conditions for operating life testing shall be the same as those specified for power burn in.
3.6 Total dose irradiation testing
3.6.1 Bias Conditions
Continuous bias shall be applied during irradiation testing as shown in Total dose radiation test.
section page 29.
3.6.2 Electrical Measurements
The parameters to be measured prior to, during and on completion of irradiation texture are
scheduled in Electrical and timing characteristics section page 9.
4 QUALITY ASSURANCE PROVISIONS
4.1 Wafer lot validation
Compliant with ATMEL Quality Management System.
For space level, Wafer Lot is accepted by a SEM performed according to AEQC0016 (AEQC0016 referred
to MIL-Std-883 method 2018 and 21400 ESCC specification).
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